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33663 参数 Datasheet PDF下载

33663图片预览
型号: 33663
PDF下载: 下载PDF文件 查看货源
内容描述: LIN 2.1 / SAEJ2602-2双LIN物理层 [LIN 2.1 / SAEJ2602-2 Dual LIN Physical Layer]
分类和应用: 电感器
文件页数/大小: 37 页 / 828 K
品牌: FREESCALE [ FREESCALE SEMICONDUCTOR, INC ]
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ELECTRICAL CHARACTERISTICS
MAXIMUM RATINGS
ELECTRICAL CHARACTERISTICS
MAXIMUM RATINGS
Table 3. Maximum Ratings
All voltages are with respect to ground unless otherwise noted. Exceeding these ratings may cause a malfunction or
permanent damage to the device.
Ratings
ELECTRICAL RATINGS
Power Supply Voltage (VSUP)
Normal Operation (DC)
Transient input voltage with external component (according to ISO7637-2 &
ISO7637-3 & “Hardware Requirements for LIN, CAN, and Flexray Interfaces
in Automotive Applications” specification Rev. 1.1/December 2nd, 2009) (See
and
- Pulse 1 (test up to the limit for Damage - Class A
)
- Pulse 2a (test up to the limit for Damage - Class A
)
- Pulse 3a (test up to the limit for Damage - Class A
)
- Pulse 3b (test up to the limit for Damage - Class A )
- Pulse 5b (Class A)
Symbol
Value
Unit
V
V
SUP(SS)
-0.3 to 27
V
SUP(S1)
V
SUP(S2A)
V
SUP(S3A)
V
SUP(S3B)
V
SUP(S5B)
V
LOG
-100
+75
-150
+100
-0.3 to 40
- 0.3 to 5.5
V
V
Logic Voltage (RXD
1,2
, TXD
1,2
, EN
1,2
Pins)
WAKE (V
WAKE1,
V
WAKE2
)
Normal Operation with in series 2*18 k resistor (DC)
Transient input voltage with external component (according to ISO7637-2 &
ISO7637-3 & “Hardware Requirements for LIN, CAN and Flexray Interfaces
in Automotive Applications” specification Rev1.1 / December 2nd, 2009) (See
and
- Pulse 1 (test up to the limit for Damage - Class D
)
- Pulse 2a (test up to the limit for Damage - Class D
)
- Pulse 3a (test up to the limit for Damage - Class D
)
- Pulse 3b (test up to the limit for Damage - Class D
)
LIN Bus Voltage (V
LIN1
, V
LIN2
)
Normal Operation (DC)
Transient (Coupled Through 1.0 nF Capacitor) (according to ISO7637-2 &
ISO7637-3) (See
and
- Pulse 1 (test up to the limit for Damage - Class D
)
- Pulse 2a (test up to the limit for Damage - Class D
)
- Pulse 3a (test up to the limit for Damage - Class D
)
- Pulse 3b (test up to the limit for Damage - Class D
)
V
WAKE(SS)
-27 to 40
V
WAKE(S1)
V
WAKE(S2A)
V
WAKE(S3A)
V
WAKE(S3B)
-100
+75
-150
+100
V
V
LIN(SS)
-27 to 40
V
LIN(S1)
V
LIN(S2A)
V
LIN(S3A)
V
LIN(S3B)
-100
+75
-150
+100
Notes
1. Class A: All functions of a device/system perform as designed during and after exposure to disturbance.
2. Class D: At least one function of the Transceiver stops working properly during the test and will return into proper operation automatically
when the exposure to the disturbance has ended. No physical damage of the IC occurs.
33663
Analog Integrated Circuit Device Data
Freescale Semiconductor
5