Noise
Shield
Noise
Shield
Pulse
Generator
tr = 5ns
+
IF
VCC
VCC
+5 V
+5 V
VO
1
2
3
4
8
7
6
5
1
2
3
4
8
7
6
5
Pulse
ZO = 50
V
RL
VF1
-
0.1 µF
Generator
tr = 5ns
ZO = 50 V
IF
VB
V01
10% DUTY CYCLE
I/f < 100 µS
RL
10% D.C.
f
VF
I/ < 100 s
m
CL = 15 pF*
VO
V02
VO
-
IF
VF2
0.1 µF
MONITOR
IF Monitor
Rm
GND
Rm
+
CL = 15 pF*
GND
Test Circuit for 6N138, 6N139
Test Circuit for HCPL-2730 and HCPL-2731
IF
5 V
VO
1.5 V
1.5 V
VOL
TPHL
TPLH
Fig. 22 Switching Time Test Circuit
IF
Noise
Shield
Noise
Shield
VCC
VCC
V01
V02
+
+5 V
+5 V
1
2
3
4
8
7
6
5
1
2
3
4
8
7
6
5
IF
VF1
-
RL
VB
RL
VO
A
VF
0.1 µF
A
B
VO
-
VO
B
VFF
VF2
+
0.1 µF
VFF
GND
GND
-
VCM
-
+
VCM
-
+
Pulse Gen
Pulse Gen
Test Circuit for HCPL-2730 and HCPL-2731
Test Circuit for 6N138 and 6N139
V
CM
10 V
90% 90%
10%
10%
tf
0 V
tr
VO
5 V
Switch at A : I F= 0 mA
VO
VOL
Switch at B : I F= 1.6 mA
Fig. 23 Common Mode Immunity Test Circuit
11
www.fairchildsemi.com
Single-Channel: 6N138, 6N139 Dual-Channel: HCPL-2730, HCPL-2731 Rev. 1.0.0
FAIRCHILD [ FAIRCHILD SEMICONDUCTOR ]
