Single-channel: 6N135, 6N136 , HCPL-2503, HCPL-4502 Dual-Channel: HCPL-2530, HCPL-2531 High Speed Transistor Optocouplers
Pulse
Generator I
F
tr = 5ns
Z
O
= 50
Ω
10% D.C.
I/f < 100µs
1
+
Noise
Shield
8
7
6
5
V
CC
+5 V
Pulse
Generator
tr = 5ns
Z
O
= 50
Ω
I
F
+
Noise
Shield
1
V
F1
-
8
7
6
5
V
CC
R
L
+5 V
2
V
F
-
V
B
R
L
10% DUTY CYCLE
I/f < 100µS
V
O
2
3
4
V
01
V
O
C
L
= 1.5
µF
3
I
F
Monitor
R
m
V
O
0.1
µF
-
I
F
MONITOR
V
F2
+
R
m
V
02
0.1
µF
4
GND
GND
C
L
= 1.5
µF
Test Circuit for 6N135, 6N136, HCPL-2503 and HCPL- 4502
Test Circuit for HCPL-2530 and HCPL-2531
I
F
0
V
O
5V
1.5 V
1.5 V
V
OL
T
PHL
T
PLH
Fig. 7 Switching Time Test Circuit
I
F
1
+
Noise
Shield
8
7
6
5
V
CC
+5 V
I
F
+
V
F1
-
A
Noise
Shield
1
2
3
4
8
7
6
5
V
CC
R
L
V
01
+5 V
2
A
B
V
FF
V
F
-
V
B
R
L
V
O
3
4
+
V
CM
V
O
V
O
0.1
µF
B
V
FF
-
V
F2
+
V
02
0.1
µF
GND
-
GND
-
Pulse Gen
+
V
CM
-
Pulse Gen
Test Circuit for 6N135, 6N136, HCPL-2503 and HCPL-4502
Test Circuit for HCPL-2530 and HCPL-2531
V
CM
10 V
10%
t
r
90%
90%
10%
t
f
0V
V
O
Switch at A : I
F
= 0 mA
V
O
Switch at A : I
F
= 16 mA
5V
V
OL
Fig. 8 Common Mode Immunity Test Circuit
8
Single-channel: 6N135, 6N136 , HCPL-2503, HCPL-4502 Dual-Channel: HCPL-2530, HCPL-2531 Rev. 1.0.3
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