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100397DC 参数 Datasheet PDF下载

100397DC图片预览
型号: 100397DC
PDF下载: 下载PDF文件 查看货源
内容描述: [TTL to ECL Transceiver, 4 Func, Complementary Output, ECL, CDIP24, CERAMIC, DIP-24]
分类和应用:
文件页数/大小: 13 页 / 132 K
品牌: FAIRCHILD [ FAIRCHILD SEMICONDUCTOR ]
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Test Circuitry (ECL-to-TTL)  
Notes:  
Rt = 50termination. When an input or output is being monitored by a scope, Rt is supplied by the scopes 50resistance. When an input or output is not  
being monitored, and external 50resistance must be applied to serve as Rt.  
The TTL 3-STATE pull up switch is connected to +7V only for ZL and LZ tests.  
TTL and ECL force signals are brought to the DUT via 50coax lines.  
VTTL is decoupled to ground with 0.1 µF to ground, VEE is decoupled to ground with 0.01 µF and GND is connected to ground.  
FIGURE 3. ECL-to-TTL AC Test Circuit  
Note:  
DIR is LOW, and OE is HIGH  
FIGURE 4. ECL-to-TTL TransitionPropagation Delay and Transition Times  
www.fairchildsemi.com  
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