Absolute Maximum Ratings(Note 2)
Recommended Operating
Conditions
Storage Temperature (TSTG
Maximum Junction Temperature (TJ)
EE Pin Potential to Ground Pin
)
−65°C to +150°C
+150°C
Case Temperature (TC)
Commercial
V
−7.0V to +0.5V
VEE to +0.5V
−50 mA
0°C to +85°C
−40°C to +85°C
−5.7V to −4.2V
Input Voltage (DC)
Industrial
Output Current (DC Output HIGH)
ESD (Note 3)
Supply Voltage (VEE
)
≥ 2000V
Note 2: Absolute maximum ratings are those values beyond which the
device may be damaged or have its useful life impaired. Functional opera-
tion under these conditions is not implied.
Note 3: ESD testing conforms to MIL-STD-883, Method 3015.
Commercial Version
DC Electrical Characteristics (Note 4)
V
EE = −4.2V to −5.7V, VCC = VCCA = GND, TC = 0°C to +85°C
Symbol
Parameter
Output HIGH Voltage
Output LOW Voltage
Output HIGH Voltage
Output LOW Voltage
Input HIGH Voltage
Min
Typ
−955
−1705
Max
−870
Units
mV
Conditions
VOH
VOL
−1025
−1830
−1035
V
IN =VIH (Max)
or VIL (Min)
IN = VIH(Min)
or VIL (Max)
Loading with
50Ω to −2.0V
Loading with
50Ω to −2.0V
−1620
mV
VOHC
VOLC
VIH
mV
V
−1610
−870
mV
−1165
−1830
0.50
mV
Guaranteed HIGH Signal
for All Inputs
VIL
Input LOW Voltage
−1475
mV
Guaranteed LOW Signal
for All Inputs
IIL
Input LOW Current
Input HIGH Current
Power Supply Current
µA
µA
V
IN = VIL (Min)
IN = VIH (Max)
IIH
IEE
240
V
−165
−80
Inputs Open
Note 4: The specified limits represent the “worst case” value for the parameter. Since these values normally occur at the temperature extremes, additional
noise immunity and guardbanding can be achieved by decreasing the allowable system operating ranges. Conditions for testing shown in the tables are cho-
sen to guarantee operation under “worst case” conditions.
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