F0321818B
2 GHz Limiting Amplifier
♦ Quality Assurance
For the Die-chip products, there is only one technically inevitable drawback in terms of
quality assurance which is to be impossible of the burn-in test for screening owing to die-
shipment. SEI will not ship them if customers do not agree on this point. On the other hand,
the lot assurance test is performed completely without any problems according to SEI’s au-
thorized rules. A microscope inspection is conducted in conformance with the MIL-STD-
883C Method 2010.7.
♦ Precautions
Owing to their small dimensions, the GaAs FET’s from which the F0321818B is designed
are easily damaged or destroyed if subjected to large transient voltages. Such transients
can be generated by power supplies when switched on if not properly decoupled. It is also
possible to induce spikes from static-electricity-charged operations or ungrounded equip-
ment.
Electron Device Department
EUDYNA [ EUDYNA DEVICES INC ]
