ESMT
M52D128168A
AC OPERATING TEST CONDITIONS (VDD=1.8V ± 0.1V, TA= 0°C ~ 70°C )
Parameter
Value
0.9 x VDDQ / 0.2
0.5 x VDDQ
tr / tf = 1 / 1
0.5 x VDDQ
See Fig.2
Unit
V
V
ns
V
Input levels (Vih/Vil)
Input timing measurement reference level
Input rise and fall time
Output timing measurement reference level
Output load condition
1.8V
Vtt =0.5x VDDQ
13.9K
50
Output
VOH(DC) = VDDQ-0.2V, IOH = -0.1mA
VOL(DC) = 0.2V, IOL = 0.1mA
Output
Z0=50
10.6K
20 pF
20 pF
(Fig.2) AC Output Load Circuit
(Fig.1) DC Output Load circuit
OPERATING AC PARAMETER
(AC operating conditions unless otherwise noted)
Version
-7.5
Parameter
Symbol
Unit
Note
-7
-10
Row active to row active delay
tRRD(min)
tRCD(min)
14
15
20
ns
ns
1
1
14
15
20
RAS to CAS delay
Row precharge time
tRP(min)
tRAS(min)
tRAS(max)
tRC(min)
14
42
15
48
100
67.5
80
1
20
50
ns
ns
1
1
Row active time
us
-
@Operating
Row cycle time
63
90
ns
1
@Auto refresh
tRFC(min)
tCDL(min)
tRDL(min)
tBDL(min)
tCCD(min)
ns
1 , 5
2
Last data in to new col. Address delay
Last data in to row precharge
Last data in to burst stop
CLK
CLK
CLK
CLK
2
2
1
2
Col. Address to col. Address delay
1
3
Mode Register command to Active or Refresh
Command
tMRD(min)
tREF(max)
2
CLK
ms
-
Refresh period(4,096 rows)
64
2
6
CAS latency=3
CAS latency=2
Number of valid output
data
ea
4
1
Note: 1. The minimum number of clock cycles is determined by dividing the minimum time required with clock cycle time and
then rounding off to the next higher integer.
3. Minimum delay is required to complete write.
4. All parts allow every cycle column address change.
5. In case of row precharge interrupt, auto precharge and read burst stop.
The earliest a precharge command can be issued after a Read command without the loss of data is CL+BL-2 clocks
5. A new command may be given tRFC after self refresh exit.
6. A maximum of eight consecutive AUTO REFRESH commands (with tRFCmin) can be posted to any given SDRAM, and
the maximum absolute interval between any AUTO REFRESH command and the next AUTO REFRESH command is
8x15.6μs.)
Elite Semiconductor Memory Technology Inc.
Publication Date: Aug. 2009
Revision: 1.3 5/48