ESMT
M14D5121632A (2H)
Operation Temperature Condition (TC) -40°C~95°C
AC Operating Test Conditions
Parameter
Value
0.5 x VDDQ
1.0
Unit
V
Note
1
Input reference voltage ( VREF
)
Input signal maximum peak swing ( VSWING(max.) )
Input signal minimum slew rate
Input level
V
1
1.0
V/ns
V
2,3
VIH / VIL
VREF
Input timing measurement reference level
V
Output timing measurement reference level (VOTR
)
0.5 x VDDQ
V
4
Note:
1. Input waveform timing is referenced to the input signal crossing through the VIH / VIL (AC) level applied to the device under
test.
2. The input signal minimum slew rate is to be maintained over the range from VREF to VIH (AC) (min.) for rising edges and the
range from VREF to VIL (AC)(max.) for falling edges as shown in the below figure.
3. AC timings are referenced with input waveforms switching from VIL (AC) to VIH (AC) on the positive transitions and VIH (AC) to
VIL (AC) on the negative transitions.
4. The VDDQ of the device under test is reference.
Elite Semiconductor Memory Technology Inc.
Publication Date : Aug. 2011
Revision : 1.1 10/62
ESMT [ ELITE SEMICONDUCTOR MEMORY TECHNOLOGY INC. ]
