ESMT
(Preliminary)
F25S04PA
Table 10: RECOMMENDED SYSTEM POWER-UP TIMINGS
Symbol
Parameter
Minimum
Unit
µs
1
TPU-READ
VDD Min to Read Operation
VDD Min to Write Operation
10
10
1
TPU-WRITE
µs
Table 11: CAPACITANCE (TA = 25°C, f=1 MHz, other pins open)
Parameter
Description
Test Condition
VOUT = 0V
Maximum
8 pF
1
COUT
Output Pin Capacitance
Input Capacitance
1
CIN
VIN = 0V
6 pF
Note 1: This parameter is measured only for initial qualification and after a design or process change that could affect this parameter.
Table 12: AC OPERATING CHARACTERISTICS
Normal 33MHz Fast 50 MHz
Fast 86 MHz Fast 100 MHz
Symbol
Parameter
Unit
Min
Max
Min
Max
Min
Max
Min
Max
FCLK
Serial Clock Frequency
33
50
86
100
MHz
ns
2
TSCKH
Serial Clock High Time
13
13
0.1
0.1
5
9
9
5
5
4
4
2
TSCKL
Serial Clock Low Time
ns
TCLCH
TCHCL
Clock Rise Time (Slew Rate)
Clock Fall Time (Slew Rate)
0.1
0.1
5
0.1
0.1
5
0.1
0.1
5
V/ns
V/ns
ns
1
TCES
CE Active Setup Time
CE Active Hold Time
CE Not Active Setup Time
CE Not Active Hold Time
CE High Time
1
TCEH
5
5
5
5
ns
1
TCHS
5
5
5
5
ns
1
TCHH
5
5
5
5
ns
TCPH
TCHZ
TCLZ
TDS
100
100
100
100
ns
6
6
6
6
ns
CE High to High-Z Output
SCK Low to Low-Z Output
Data In Setup Time
0
2
5
5
5
0
2
5
5
5
0
2
5
5
5
0
2
5
5
5
ns
ns
TDH
Data In Hold Time
ns
THLS
THHS
ns
HOLD Low Setup Time
HOLD High Setup Time
ns
Elite Semiconductor Memory Technology Inc.
Publication Date: May 2009
Revision: 0.2 23/34
ESMT [ ELITE SEMICONDUCTOR MEMORY TECHNOLOGY INC. ]
