EM47EM0888SBA
AC Operating Test Characteristics
(VDD, VDDQ=1.5V±0.075V)
Speed Bin
-150 (DDR3-1333)
-187 (DDR3-1066)
Symbol
Units Notes
CL-nRCD-nRP
Parameter
9-9-9
7-7-7
Min.
165
Max.
-
Min.
195
Max.
-
Write leveling setup time from
rising CK,/CK crossing to rising
DQS,/DQS crossing
tWLS
ps
ps
Write leveling hold time from
rising DQS,/DQS crossing to
rising CK,/CK crossing
tWLH
165
-
195
-
tWLO
tWLOE
Write leveling output delay
Write leveling output error
Absolute clock period
0
0
7.5
2
CK (avg)max+
tJIT (per)max
0
0
9
2
ns
ns
ps
tCK (avg)min+
tJIT(per)min
t
t
CK (avg)min+
tJIT (per)min
t
CK (avg)max+
tJIT (per)max
tCK (abs)
tCK
(avg)
tCH (abs)
Absolute clock high pulse width
0.43
-
0.43
-
30
31
tCK
(avg)
tCL (abs)
tJIT (per)
Absolute clock low pulse width
Clock period jitter
0.43
-70
-60
-
-
0.43
-80
-70
-
-
70
80
ps
ps
ps
ps
Clock period jitter during DLL
locking period
tJIT (per,lck)
tJIT (cc)
60
70
Cycle to cycle period jitter
140
120
160
140
Cycle to cycle period jitter during
DLL locking period
tJIT (cc,lck)
-
-
tERR (2per) Cumulative error across 2 cycles
tERR (3per) Cumulative error across 3 cycles
tERR (4per) Cumulative error across 4 cycles
tERR (5per) Cumulative error across 5 cycles
tERR (6per) Cumulative error across 6 cycles
tERR (7per) Cumulative error across 7 cycles
tERR (8per) Cumulative error across 8 cycles
tERR (9per) Cumulative error across 9 cycles
-103
-122
-136
-147
-155
-163
-169
-175
103
122
136
147
155
163
169
175
-118
-140
-155
-168
-177
-186
-193
-200
118
140
155
168
177
186
193
200
ps
ps
ps
ps
ps
ps
ps
ps
Cumulative error across 10
tERR (10per)
cycles
-180
-184
-188
180
184
188
-205
-210
-215
205
210
215
ps
ps
ps
Cumulative error across 11
tERR (11per)
cycles
Cumulative error across 12
tERR (12per)
cycles
Cumulative error across
tERR (nper)
t
ERR (nper)min=(1+0.68ln(n))*tJIT (per)min
ERR (nper)max=(1+0.68ln(n))*tJIT (per)max
ps
32
n= 13,14,… 49,50 cycles
t
Apr. 2012
21/39
www.eorex.com
EOREX [ EOREX CORPORATION ]
