EN29LV641H/L EN29LV640U
Test Conditions
3.3 V
2.7 kΩ
Device under Test
CL
6.2 kΩ
Note: Diodes are IN3064 or equivalent
Test Specifications
Test Conditions
70R
90
Unit
Output Load
1 TTL Gate
Output Load Capacitance, CL
Input Rise and Fall times
Input Pulse Levels
30
5
30
5
pF
ns
V
0.0-3.0
1.5
0.0-3.0
1.5
Input timing measurement reference levels
Output timing measurement reference levels
V
0.5VIO
0.5VIO
V
.
Key to Switching Waveforms
This Data Sheet may be revised by subsequent versions
or modifications due to changes in technical specifications.
©2005 Eon Silicon Solution, Inc., www.essi.com.tw
32
Rev. B, Issue Date: 2005/06/27