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EN29GL064T-70TIP 参数 Datasheet PDF下载

EN29GL064T-70TIP图片预览
型号: EN29GL064T-70TIP
PDF下载: 下载PDF文件 查看货源
内容描述: 64兆位( 8192K ×8位/ 4096K ×16位)闪存 [64 Megabit (8192K x 8-bit / 4096K x 16-bit) Flash Memory]
分类和应用: 闪存
文件页数/大小: 66 页 / 3236 K
品牌: EON [ EON SILICON SOLUTION INC. ]
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Preliminary EN29GL064  
USER MODE DEFINITIONS  
Word / Byte Configuration  
The BYTE# pin controls whether the device data I/O pins operate in the byte or word configuration. If the  
BYTE# pin is set at logic ‘1’, the device is in word configuration, DQ0-DQ15 are active and controlled by  
CE# and OE#.  
If the BYTE# pin is set at logic ‘0’, the device is in byte configuration, and only data I/O pins DQ0-DQ7  
are active and controlled by CE# and OE#. The data I/O pins DQ8-DQ14 are tri-stated, and the DQ15  
pin is used as an input for the LSB (A-1) address function.  
VIO Control  
The VIO allows the host system to set the voltage levels that the device generates and tolerates on all  
inputs and outputs (address, control, and DQ signals). VIO range is 1.65 to VCC. For example, a VIO of  
1.65-3.6 volts allows for I/O at the 1.65 or 3.6 volt levels, driving and receiving signals to and from other  
1.65 or 3.6 V devices on the same data bus. Only 48-pin TSOP package does not offer VIO function.  
Read  
All memories require access time to output array data. In a read operation, data is read from one  
memory location at a time. Addresses are presented to the device in random order, and the propagation  
delay through the device causes the data on its outputs to arrive with the address on its inputs.  
The device defaults to reading array data after device power-up or hardware reset. To read data from  
the memory array, the system must first assert a valid address on A21-A0, while driving OE# and CE#  
to VIL. WE# must remain at VIH. All addresses are latched on the falling edge of CE#. Data will appear  
on DQ15-DQ0 after address access time (tACC), which is equal to the delay from stable addresses to  
valid output data.The OE# signal must be driven to VIL. Data is output on DQ15-DQ0 pins after the  
access time (tOE) has elapsed from the falling edge of OE#, assuming the tACC access time has been  
meet.  
Page Read Mode  
The device is capable of fast page mode read and is compatible with the page mode Mask ROM read  
operation. This mode provides faster read access speed for random locations within a page. The page  
size of the device is 8 words/16 bytes. The appropriate page is selected by the higher address bits A21-  
A3. Address bits A2-A0 in word mode (A2 to A-1 in byte mode) determine the specific word within a  
page. The microprocessor supplies the specific word location.  
The random or initial page access is equal to tACC or tCE and subsequent page read accesses (as long  
as the locations specified by the microprocessor falls within that page) is equivalent to tPACC. When  
CE# is deasserted and reasserted for a subsequent access, the access time is tACC or tCE. Fast page  
mode accesses are obtained by keeping the “read-page addresses” constant and changing the “intra-  
read page” addresses.  
Autoselect  
The Autoselect mode provides manufacturer ID, Device identification, and sector protection information,  
through identifier codes output from the internal register (separate from the memory array) on DQ7-DQ0.  
This mode is primarily intended for programming equipment to automatically match a device to be  
programmed with its corresponding programming algorithm. The Autoselect codes can also be  
accessed in-system.  
There are two methods to access autoselect codes. One uses the autoselect command, the other  
applies VID on address pin A9.  
When using programming equipment, the autoselect mode requires VID (8.5 V to 9.5 V) on address pin  
This Data Sheet may be revised by subsequent versions  
or modifications due to changes in technical specifications.  
©2004 Eon Silicon Solution, Inc., www.eonssi.com  
18  
Rev. A, Issue Date: 2009/3/20  
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