EL2001C
Low Power, 70 MHz Buffer Amplifier
Absolute Maximum Ratings
a b
b
)
g
V
V
I
Supply Voltage (V
V
18V or 36V
T
Operating Temperature Range
EL2001AC/EL2001C
S
A
a
0 C to 75 C
150 C
g
Input Voltage (Note 1)
Input Current (Note 1)
15V or V
§
§
§
§
IN
S
g
See Curves
50 mA
T
T
Operating Junction Temperature
Storage Temperature
IN
J
b
a
65 C to 150 C
P
Power Dissipation (Note 2)
Output Short Circuit
Duration (Note 3)
§
D
ST
Continuous
Important Note:
All parameters having Min/Max specifications are guaranteed. The Test Level column indicates the specific device testing actually
performed during production and Quality inspection. Elantec performs most electrical tests using modern high-speed automatic test
e
e
T
A
equipment, specifically the LTX77 Series system. Unless otherwise noted, all tests are pulsed tests, therefore T
T
.
J
C
Test Level
Test Procedure
I
100% production tested and QA sample tested per QA test plan QCX0002.
e
e
25 C ,
II
100% production tested at T
25 C and QA sample tested at T
§
§
A
A
T
and T
per QA test plan QCX0002.
MIN
MAX
QA sample tested per QA test plan QCX0002.
Parameter is guaranteed (but not tested) by Design and Characterization Data.
III
IV
V
e
Parameter is typical value at T
25 C for information purposes only.
§
A
e
e
50X, unless otherwise specified
g
Electrical Characteristics
V
S
15V, R
S
EL2001AC
EL2001C
Test Conditions
Limits
Parameter
Description
Units
Test
V
Load
Temp
25 C
Min
Typ
Max
IN
Level
b
V
Offset Voltage
10
2
I
I
III
I
mV
mV
mV
mV
mA
§
OS
%
0
0
0
0
EL2001A/EL2001AC
b
a
T
T
T
T
T
, T
MIN MAX
15
15
EL2001/EL2001C
b
a
25 C
§
30
2
1
1
8
30
%
%
b
a
, T
MIN MAX
40
40
III
I
b
b
b
a
3
I
IN
Input Current
25 C
§
3
6
5
EL2001A/EL2001AC
a
a
, T
MIN MAX
6
5
III
I
mA
EL2001/EL2001C
25 C
§
mA
%
b
a
10
, T
MIN MAX
10
III
I
mA
R
Input Resistance
25
1
MX
MX
§
IN
g
12V
100X
, T
MIN MAX
0.5
III
2
ELANTEC [ ELANTEC SEMICONDUCTOR ]
