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5962-8778701CA 参数 Datasheet PDF下载

5962-8778701CA图片预览
型号: 5962-8778701CA
PDF下载: 下载PDF文件 查看货源
内容描述: [Operational Amplifier,]
分类和应用:
文件页数/大小: 12 页 / 55 K
品牌: ELANTEC [ ELANTEC SEMICONDUCTOR ]
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4. QUALITY ASSURANCE PROVISIONS  
4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535,  
appendix A.  
4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices  
prior to quality conformance inspection. The following additional criteria shall apply:  
a. Burn-in test, method 1015 of MIL-STD-883.  
(1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision  
level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall  
specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in  
test method 1015 of MIL-STD-883.  
(2) T = +125°C, minimum.  
A
b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter  
tests prior to burn-in are optional at the discretion of the manufacturer.  
4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD-  
883 including groups A, B, C, and D inspections. The following additional criteria shall apply.  
4.3.1 Group A inspection.  
a. Tests shall be as specified in table II herein.  
b. Subgroups 10 and 11 in table I, method 5005 of MIL-STD-883 shall be omitted.  
4.3.2 Groups C and D inspections.  
a. End-point electrical parameters shall be as specified in table II herein.  
b. Steady-state life test conditions, method 1005 of MIL-STD-883.  
(1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision  
level control and shall be made available to the preparing or acquiring activity upon request. The test circuit  
shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent  
specified in test method 1005 of MIL-STD-883.  
(2) T = +125°C, minimum.  
A
(3) Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883.  
SIZE  
STANDARD  
MICROCIRCUIT DRAWING  
5962-87787  
A
DEFENSE SUPPLY CENTER COLUMBUS  
COLUMBUS, OHIO 43216-5000  
REVISION LEVEL  
SHEET  
A
10  
DSCC FORM 2234  
APR 97