DS1012
TEST SETUP DESCRIPTION
Figure 2 illustrates the hardware configuration used for
measuring the timing parameters on the DS1012. The
input waveform is produced by a precision pulse gener-
ator under software control connected to the inputs by
VHF switch control units. Time delays are measured by
a time interval counter (20 ps resolution) connected be-
tween the inputs and the outputs. Outputs are con-
nected to the counter by a VHF switch control unit. All
measurements are fully automated, with each instru-
ment controlled by a central computer over an IEEE 488
bus.
TEST CONDITIONS
INPUT:
Ambient Temperature:
Supply Voltage (V
CC
):
Input Pulse:
Source Impedance:
Rise and Fall Time:
Pulse Width:
Period:
25°C
±
3°C
5.0V
±
0.1V
High = 3.0V
±
0.1V
Low = 0.0V
±
0.1V
50 ohms max.
3.0 ns max.
50 ns
100 ns
OUTPUT:
Each output is loaded with a 74F04. Delay is measured
between the 1.5V level of the rising edge of the input sig-
nal and the 1.5V level of the corresponding edge of the
output.
NOTE:
These conditions are for test only and do
not restrict the operation of the device un-
der other data sheet conditions.
021798 4/7
DALLAS [ DALLAS SEMICONDUCTOR ]
