CY7C419/21/25/29/33
Maximum Rating
Exceeding maximum ratings may impair the useful life of the
device. These user guidelines are not tested.
Storage Temperature ................................. –65
°
C to +150
°
C
Ambient Temperature with Power Applied.. –55
°
C to +125
°
C
Supply Voltage to Ground Potential................–0.5V to +7.0V
DC Voltage Applied to Outputs
in High Z State ................................................–0.5V to +7.0V
DC Input Voltage ............................................–0.5V to +7.0V
Power Dissipation.......................................................... 1.0W
Electrical Characteristics
Over the Operating Range
Parameter
V
OH
V
OL
V
IH
V
IL
I
IX
I
OZ
I
OS
Description
Output HIGH Voltage
Output LOW Voltage
Input HIGH Voltage
Input LOW Voltage
Input Leakage Current
Output Leakage Current
Output Short Circuit Current
Output Current, into Outputs (LOW)............................ 20 mA
Static Discharge Voltage............................................ >2000V
(per MIL–STD–883, Method 3015)
Latch-Up Current ..................................................... >200 mA
Operating Range
Range
Commercial
Industrial
Ambient Temperature
0
°
C to + 70
°
C
–40
°
C to +85
°
C
V
CC
5V
±
10%
5V
±
10%
Test Conditions
V
CC
= Min., I
OH
= –2.0 mA
V
CC
= Min., I
OL
= 8.0 mA
Commercial
Industrial
GND < V
I
< V
CC
R > V
IH
, GND < V
O
< V
CC
V
CC
= Max., V
OUT
= GND
All Speed Grades
Min
2.4
2.0
2.2
Max
0.4
V
CC
V
CC
0.8
+10
+10
–90
Unit
V
V
V
V
μA
μA
mA
–10
–10
Notes
1. Single Power Supply: The voltage on any input or I/O pin can not exceed the power pin during power-up.
2. T
A
is the “instant on” case temperature.
3. See the last page of this specification for Group A subgroup testing information.
4. V
IL
(Min.) = –2.0V for pulse durations of less than 20 ns.
5. For test purposes, not more than one output at a time should be shorted. Short circuit test duration should not exceed 30 seconds.
Document #: 38-06001 Rev. *C
Page 3 of 17
CYPRESS [ CYPRESS SEMICONDUCTOR ]
