CY7C132/CY7C136
CY7C142/CY7C146
Electrical Characteristics
Over the Operating Range
[6]
7C132-30
[3]
7C136-25,30
7C142-30
7C136-15
[3,4]
7C146-25,30
7C146-15
Parameter Description
V
OH
V
OL
V
IH
V
IL
I
IX
I
OZ
I
OS
I
CC
Test Conditions
Min.
2.4
0.4
0.5
2.2
0.8
GND < V
I
< V
CC
GND < V
O
< V
CC
,
Output Disabled
V
CC
= Max.,
V
OUT
= GND
CE = V
IL
,
Outputs Open,
f = f
MAX[9]
Com’l
Mil
75
65
-5
-5
+5
+5
-350
190
−5
−5
2.2
0.8
+5
+5
−350
170
−5
−5
Max.
Min.
2.4
0.4
0.5
2.2
0.8
+5
+5
−350
120
170
45
65
135
115
90
115
15
15
15
15
125
105
85
105
−5
−5
Max.
Output HIGH Voltage V
CC
= Min., I
OH
= -4.0 mA
Output LOW Voltage I
OL
= 4.0 mA
I
OL
= 16.0 mA
[7]
Input HIGH Voltage
Input LOW Voltage
Input Load Current
Output Leakage
Current
Output Short
Circuit Current
[8]
V
CC
Operating
Supply Current
Standby Current
Both Ports,
TTL Inputs
Standby Current
One Port,
TTL Inputs
Standby Current
Both Ports,
CMOS Inputs
Standby Current
One Port,
CMOS Inputs
7C132-35
7C136-35
7C142-35
7C146-35
Min. Max.
2.4
0.4
0.5
2.2
0.8
+5
+5
−350
90
120
35
45
75
90
15
15
70
85
mA
mA
mA
mA
7C132-45,55
7C136-45,55
7C142-45,55
7C146-45,55
Min.
2.4
0.4
0.5
V
V
µA
µA
mA
mA
Max. Unit
V
V
I
SB1
CE
L
and CE
R
> V
IH
, Com’l
f = f
MAX[9]
Mil
CE
L
or CE
R
> V
IH
, Com’l
Active Port Outputs
Mil
Open,
f = f
MAX[9]
Both Ports CE
L
and
CE
R
> V
CC
– 0.2V,
V
IN
> V
CC
– 0.2V or
V
IN
< 0.2V, f = 0
One Port CE
L
or
CE
R
> V
CC
– 0.2V,
V
IN
> V
CC
– 0.2V or
V
IN
< 0.2V,
Active Port Outputs
Open,
f = f
MAX[9]
Com’l
Mil
Com’l
Mil
I
SB2
I
SB3
I
SB4
]
Capacitance
[10]
Parameter
C
IN
C
OUT
Description
Input Capacitance
Output Capacitance
Test Conditions
T
A
= 25°C, f = 1 MHz,
V
CC
= 5.0V
Max.
15
10
Unit
pF
pF
Notes:
6. See the last page of this specification for Group A subgroup testing information.
7. BUSY and INT pins only.
8. Duration of the short circuit should not exceed 30 seconds.
9. At f=f
MAX
, address and data inputs are cycling at the maximum frequency of read cycle of 1/t
rc
and using AC Test Waveforms input levels of GND to 3V.
10. This parameter is guaranteed but not tested.
3
CYPRESS [ CYPRESS SEMICONDUCTOR ]
