欢迎访问ic37.com |
会员登录 免费注册
发布采购

CY62128L-70SC 参数 Datasheet PDF下载

CY62128L-70SC图片预览
型号: CY62128L-70SC
PDF下载: 下载PDF文件 查看货源
内容描述: 128K ×8静态RAM [128K x 8 Static RAM]
分类和应用:
文件页数/大小: 8 页 / 254 K
品牌: CYPRESS [ CYPRESS SEMICONDUCTOR ]
 浏览型号CY62128L-70SC的Datasheet PDF文件第1页浏览型号CY62128L-70SC的Datasheet PDF文件第2页浏览型号CY62128L-70SC的Datasheet PDF文件第4页浏览型号CY62128L-70SC的Datasheet PDF文件第5页浏览型号CY62128L-70SC的Datasheet PDF文件第6页浏览型号CY62128L-70SC的Datasheet PDF文件第7页浏览型号CY62128L-70SC的Datasheet PDF文件第8页  
PRELIMINARY
Capacitance
[5]
Parameter
C
IN
C
OUT
Description
Input Capacitance
Output Capacitance
Test Conditions
T
A
= 25°C, f = 1 MHz,
V
CC
= 5.0V
Max.
9
9
CY62128
Unit
pF
pF
AC Test Loads and Waveforms
5V
OUTPUT
100 pF
INCLUDING
JIG AND
SCOPE
(a)
Equivalent to:
R1 1800
R1 1800
5V
OUTPUT
R2
990
5 pF
INCLUDING
JIG AND
SCOPE
(b)
R2
990
GND
5ns
3.0V
90%
10%
90%
10%
5 ns
ALL INPUT PULSES
62128-3
62128-4
THÉVENIN EQUIVALENT
639
1.77V
OUTPUT
Switching Characteristics
[3,6]
Over the Operating Range
62128–55
Parameter
READ CYCLE
t
RC
t
AA
t
OHA
t
ACE
t
DOE
t
LZOE
t
HZOE
t
LZCE
t
HZCE
t
PU
t
PD
t
WC
t
SCE
t
AW
t
HA
t
SA
t
PWE
t
SD
Read Cycle Time
Address to Data Valid
Data Hold from Address Change
CE
1
LOW to Data Valid, CE
2
HIGH to Data Valid
OE LOW to Data Valid
OE LOW to Low Z
OE HIGH to High Z
[7, 8]
CE
1
LOW to Low Z, CE
2
HIGH to Low Z
[8]
CE
1
HIGH to High Z, CE
2
LOW to High Z
[7, 8]
CE
1
LOW to Power-Up, CE
2
HIGH to Power-Up
CE
1
HIGH to Power-Down, CE
2
LOW to Power-Down
Write Cycle Time
CE
1
LOW to Write End, CE
2
HIGH to Write End
Address Set-Up to Write End
Address Hold from Write End
Address Set-Up to Write Start
WE Pulse Width
Data Set-Up to Write End
55
45
45
0
0
45
45
0
55
70
60
60
0
0
50
55
5
20
0
70
0
20
5
25
5
55
20
0
25
55
55
5
70
35
70
70
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
Description
Min.
Max.
62128–70
Min.
Max.
Unit
WRITE CYCLE
[9]
Shaded areas contain advance information
Notes:
5. Tested initially and after any design or process changes that may affect these parameters.
6. Test conditions assume signal transition time of 5ns or less, timing reference levels of 1.5V, input pulse levels of 0 to 3.0V, and output loading of the specified
I
OL
/I
OH
and 100pF load capacitance.
7. t
HZOE
, t
HZCE
, and t
HZWE
are specified with a load capacitance of 5 pF as in part (b) of AC Test Loads. Transition is measured
±500
mV from steady-state voltage.
8. At any given temperature and voltage condition, t
HZCE
is less than t
LZCE
, t
HZOE
is less than t
LZOE
, and t
HZWE
is less than t
LZWE
for any given device.
9. The internal write time of the memory is defined by the overlap of CE
1
LOW, CE
2
HIGH, and WE LOW. CE
1
and WE must be LOW and CE
2
HIGH to initiate a write,
and the transition of any of these signals can terminate the write. The input data set-up and hold timing should be referenced to the leading edge of the signal that terminates
the write.
3