PLDC20RA10
Maximum Ratings
(Above which the useful life may be impaired. For user guide-
lines, not tested.)
Storage Temperature ................................. –65°C to +150°C
Ambient Temperature with
Power Applied............................................. –55°C to +125°C
Supply Voltage to Ground Potential
(Pin 24 to Pin 12) ........................................... –0.5V to +7.0V
DC Voltage Applied to Outputs
in High Z State ............................................... –0.5V to +7.0V
DC Input Voltage......................................... –3.0 V to + 7.0 V
Output Current into Outputs (LOW) .............................16 mA
]
Static Discharge Voltage ........................................... >2001V
(per MIL-STD-883, Method 3015)
Latch-Up Current..................................................... >200 mA
DC Program Voltage .................................................... 13.0V
Operating Range
Range
Commercial
Military
Ambient
Temperature
0
°
C to +75
°
C
–55
°
C to +125
°
C
V
CC
5V
±
10%
5V
±
10%
Electrical Characteristics
Over the Operating Range
Parameter
V
OH
V
OL
V
IH
V
IL
I
IX
I
OZ
I
SC
I
CC1
I
CC2
Description
Output HIGH Voltage
Output LOW Voltage
Input HIGH Level
Input LOW Level
Input Leakage Current
Output Leakage Current
Output Short Circuit Current
Standby Power Supply Current
Power Supply Current at
Frequency
V
CC
= Min.,
V
IN
=V
IH
or V
IL
V
CC
= Min.,
V
IN
= V
IH
or V
IL
Test Conditions
I
OH
= –3.2 mA
I
OH
= –2 mA
I
OL
= 8 mA
2.0
0.8
–10
–40
–30
Com’l
Mil
V
CC
= Max., Outputs Disabled (In High Z
State) Device Operating at f
MAX
Com’l
Mil
+10
+40
–90
75
80
80
85
Com’l
Mil
0.5
V
V
V
µA
µA
mA
mA
mA
mA
mA
Min.
2.4
Max.
Unit
V
Guaranteed Input Logical HIGH Voltage for All Inputs
Guaranteed Input Logical LOW Voltage for All Inputs
V
SS
≤
V
IN
≤
V
CC
, V
CC
= Max
V
CC
= Max., V
SS
≤
V
OUT
≤
V
CC
V
CC
= Max., V
OUT
= 0.5V
V
CC
= Max., V
IN
= GND Outputs Open
Capacitance
Parameter
C
IN
C
OUT
Description
Input Capacitance
Output Capacitance
Test Conditions
V
IN
= 2.0 V @ f = 1 MHz
V
OUT
= 2.0 V @ f = 1 MHz
Max.
10
10
Unit
pF
pF
Notes:
2. T
A
is the “instant on” case temperature.
3. See the last page of this specification for Group A subgroup testing information.
4. These are absolute values with respect to device ground and all overshoots due to system or tester noise are included.
5. Tested initially and after any design or process changes that may affect these parameters.
6. Not more than one output should be tested at a time. Duration of the short circuit should not be more than one second. V
OUT
= 0.5 V has been chosen to
avoid test problems caused by tester ground degradation.
Document #: 38-03012 Rev. **
Page 5 of 14
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