CY7C372i
Maximum Ratings
(Above which the useful life may be impaired. For user guide-
lines, not tested.)
Storage Temperature ................................. –65°C to +150°C
Ambient Temperature with
Power Applied............................................. –55°C to +125°C
Supply Voltage to Ground Potential ............... –0.5V to +7.0V
DC Voltage Applied to Outputs
in High-Z State ............................................... –0.5V to +7.0V
DC Input Voltage............................................ –0.5V to +7.0V
DC Program Voltage .....................................................12.5V
Output Current into Outputs ........................................ 16 mA
Static Discharge Voltage........................................... > 2001V
(per MIL–STD–883, Method 3015)
Latch-up Current..................................................... > 200 mA
Operating Range
Range
Commercial
Industrial
Military
[2]
Ambient
Temperature
0°C to +70°C
−40°C
to +85°C
–55°C to +125°C
V
CC
V
CCINT
V
CCIO
5V
±
0.25V 5V
±
0.25V or
3.3V
±
0.3V
5V
±
0.5V
5V
±
0.5V
5V
±
0.5V
3.3V
±
0.3V
Electrical Characteristics
Over the Operating Range
[3, 4]
Parameter
V
OH
V
OHZ
V
OL
V
IH
V
IL
I
IX
I
OZ
Description
Output HIGH Voltage
Output HIGH Voltage with
Output Disabled
[8]
Output LOW Voltage
Input HIGH Voltage
Input LOW Voltage
Input Load Current
Output Leakage Current
Test Conditions
V
CC
= Min. I
OH
= –3.2 mA
V
CC
= Max. I
OH
= 0
µA
(Com’l/Ind)
[5]
I
OH
= –2.0 mA (Mil)
(Com’l/Ind)
[5, 6]
I
OH
= –50
µA
(Com’l/Ind)
[5, 6]
V
CC
= Min. I
OL
= 16 mA (Com’l/Ind)
[5]
I
OL
= 12 mA (Mil)
Guaranteed Input Logical HIGH Voltage for all
Inputs
[7]
Guaranteed Input Logical LOW Voltage for all
Inputs
[7]
V
I
= Internal GND, V
I
= V
CC
V
CC
= Max., V
O
= GND or V
O
= V
CC
, Output
Disabled
V
CC
= Max., V
O
= 3.3V, Output Disabled
[6]
I
OS
I
CC
Output Short
Circuit Current
[8, 9]
Power Supply Current
[10]
V
CC
= Max., V
OUT
= 0.5V
V
CC
= Max., I
OUT
= 0 mA,
f = 1 MHz, V
IN
= GND, V
CC
V
CC
= Min., V
IL
= 0.8V
V
CC
= Min., V
IH
= 2.0V
V
CC
= Max.
V
CC
= Max.
Com’l/Ind.
Com’l “L” –66
Military
I
BHL
I
BHH
I
BHLO
I
BHHO
Input Bus Hold LOW
Sustaining Current
Input Bus Hold HIGH
Sustaining Current
Input Bus Hold LOW
Overdrive Current
Input Bus Hold HIGH
Overdrive Current
+75
–75
+500
−500
2.0
–0.5
–10
–50
0
–30
75
45
75
–70
Min.
2.4
2.4
4.0
3.6
0.5
0.5
7.0
0.8
+10
+50
–125
–160
125
75
200
Typ.
Max.
Unit
V
V
V
V
V
V
V
V
µA
µA
µA
mA
mA
mA
mA
µA
µA
µA
µA
Notes:
2. T
A
is the “instant on” case temperature.
3. See the last page of this specification for Group A subgroup testing information.
4. If V
CCIO
is not specified, the device can be operating in either 3.3V or 5V I/O mode; V
CC
= V
CCINT
.
5. For SDO: I
OH
=–2 mA, I
OL
= 2 mA.
6. When the I/O is three-stated, the bus-hold circuit can weakly pull the I/O to a maximum of 4.0V if no leakage current is allowed. This voltage is lowered significantly
by a small leakage current. Note that all I/Os are three-stated during ISR programming. Refer to the application note “Understanding Bus Hold” for additional
information.
7. These are absolute values with respect to device ground. All overshoots due to system or tester noise are included.
8. Not more than one output should be tested at a time. Duration of the short circuit should not exceed 1 second. V
OUT
= 0.5V has been chosen to avoid test
problems caused by tester ground degradation.
9. Tested initially and after any design or process changes that may affect these parameters.
10. Measured with 16-bit counter programmed into each logic block.
Document #: 38-03033 Rev. *A
Page 4 of 13
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