Bt8370/8375/8376
3.16 Data Link Registers
Fully Integrated T1/E1 Framer and Line Interface
0BA—DLINK Test Configuration (DL_TEST1)
Data link test registers [addr 0BA-0BE] are for CONEXANT production test. Set to 0 for normal operation.
7
6
5
4
3
2
1
0
—
—
—
—
DL_TEST1[3]
DL_TEST1[2]
DL_TEST1[1]
DL_TEST1[0]
DL_TEST1[3]
Clock Test—Zero for normal operation, where clocks are controlled by DL1_CTL and
DL2_CTL [addr 0A6, 0B1]. When active-high, clocks are enabled.
DL_TEST1[2]
Shadow Select—Report shadow pointers instead of normal read/write pointers.
DL_TEST1[1, 0]
FIFO Select: 00 = RDL1; 01 = RDL2; 10 = TDL1; 11 = TDL2
0BB—DLINK Test Status (DL_TEST2)
7
6
5
4
3
2
1
0
—
—
DL_TEST2[5]
DL_TEST2[4]
DL_TEST2[3]
DL_TEST2[2]
DL_TEST2[1]
DL_TEST2[0]
DL_TEST2[5:0]
Read or Shadow Read Pointer—Reports selected FIFO read pointer current address.
0BC—DLINK Test Status (DL_TEST3)
7
6
5
4
3
2
1
0
—
—
DL_TEST3[5]
DL_TEST3[4]
DL_TEST3[3]
DL_TEST3[2]
DL_TEST3[1]
DL_TEST3[0]
DL_TEST3[5:0]
Write or Shadow Write Pointer—Specifies selected FIFO write pointer address.
0BD—DLINK Test Control #1 or Configuration #2 (DL_TEST4)
7
6
5
4
3
2
1
0
—
DL_TEST4[6]
DL_TEST4[5]
DL_TEST4[4]
DL_TEST4[3]
DL_TEST4[2]
DL_TEST4[1]
DL_TEST4[0]
DL_TEST4[6]
DL_TEST4[5]
DL_TEST4[4]
DL_TEST4[3]
DL_TEST4[2]
DL_TEST4[1]
DL_TEST4[0]
TFIFO1 Read Clear—Force transmit FIFO read pointer to empty.
TFIFO1 Write Clear—Force transmit FIFO write pointer to empty.
TFIFO1 Write—MPU data goes to specified write pointer address.
RFIFO1 Read Clear—Force receive FIFO read pointer to empty state (flush).
RFIFO1 Write Clear—Force receive FIFO write pointer to empty state (flush).
RFIFO1 Write—MPU data goes to specified write pointer address.
RFIFO1 Bypass—Pipe receive data.
3-110
Conexant
N8370DSE