CM1233
IEC 6100-4-2
Test Standards
Voltage
Probe
IEC 6100-4-2
Test Standards
CM1233
Voltage
Probe
Device Under
Protection (DUP)
Standard
ESD Device
R
VARIABLE
Device Under
Protection (DUP)
R
VARIABLE
Standard ESD
Device Test Setup
Current
Probe
I
RESIDUAL
Current
Probe
I
RESIDUAL
CM1233 Test Setup
Figure 6. Test Setups: Standard Device (Left) and CM1233 (Right)
Impedance (25
Ω
/div)
100.0Ω
Time (100.0ps /div)
Figure 7. Typical Channel TDR Measured Across Out_x and In_x Per Each Differential Channels Pair
(Typical 200ps Incident Rise Time)
© 2008 California Micro Devices Corp. All rights reserved.
490 N. McCarthy Blvd., Milpitas, CA 95035-5112
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Tel: 408.263.3214
Issue A – 03/18/08
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Fax: 408.263.7846
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