ELECTRICAL SPECIFICATIONS
T
A
= +25
°C,
AV
CC
= +10 V, AV
EE
=-10.0 V, DV
EE
=-5.2 V, RL = 50 Ohm to -2V, unless otherwise specified.
PARAMETERS
DC ELECTRICAL CHARACTERISTICS
Power Dissipation
Output High Level
Output Low Level
AC ELECTRICAL CHARACTERISTICS
Propagation Delay
1
Propagation Delay TEMPCO
Propagation Delay Skew (A vs B)
Propagation Delay Dispersion
2
Latch Set-up Time
Latch to Output Delay
Latch Pulse Width
Latch Hold Time
Rise Time
Fall Time
Slew Rate
TEST
CONDITIONS
TEST
LEVEL
MIN
TYP
MAX
UNITS
Dual
ECL 50 Ohms to -2V
ECL 50 Ohms to -2V
I
I
I
-.98
-1.95
700
895
-.70
-1.65
mW
V
V
150 mV O.D.
IV
V
V
1.5
2.0
2
100
200
1.7
0.8
2
-1.9
0.4
0.4
3
2.5
ns
ps/
°C
ps
ps
ns
ns
ns
ns
ns
ns
V/ns
150 mV Overdrive Min.
V
V
150 mV O.D.
V
V
V
20% to 80%
20% to 80%
V
V
V
NOTES:
1
Valid for both high-to-low and low-to-high transitions.
2
Dispersion is the change in propagation delay due to changes in slew rate, overdrive, and common mode level.
TEST LEVEL CODES
All electrical characteristics are subject to the
following conditions:
All parameters having min/max specifications
are guaranteed. The Test Level column indi-
cates the specific device testing actually per-
formed during production and Quality Assur-
ance inspection. Any blank section in the data
column indicates that the specification is not
tested at the specified condition.
TEST LEVEL
I
II
III
IV
V
VI
TEST PROCEDURE
100% production tested at the specified temperature.
100% production tested at T
A
=25
°C,
and sample
tested at the specified temperatures.
QA sample tested only at the specified temperatures.
Parameter is guaranteed (but not tested) by design
and characterization data.
Parameter is a typical value for information purposes
only.
100% production tested at T
A
= 25
°C.
Parameter is
guaranteed over specified temperature range.
SPT9691
3
10/6/97
CADEKA [ CADEKA MICROCIRCUITS LLC. ]
