TEST LEVEL CODES
All electrical characteristics are subject to the
following conditions:
All parameters having min/max specifications
are guaranteed. The Test Level column indi-
cates the specific device testing actually per-
formed during production and Quality Assur-
ance inspection. Any blank section in the data
column indicates that the specification is not
tested at the specified condition.
TEST LEVEL
I
II
III
IV
V
VI
TEST PROCEDURE
100% production tested at the specified temperature.
100% production tested at T
A
=25
°C,
and sample
tested at the specified temperatures.
QA sample tested only at the specified temperatures.
Parameter is guaranteed (but not tested) by design
and characterization data.
Parameter is a typical value for information purposes
only.
100% production tested at T
A
= 25
°C.
Parameter is
guaranteed over specified temperature range.
Figure 1A: Timing Diagram
N
N+1
tpwH
CLK
tpwL
N+2
CLK
td
Data Valid
N
Data Valid
N+1
Output
Data
Figure 1B: Single Event Clock
CLK
CLK
t
d
Output
Data
Data Valid
Table I - Timing Parameters
PARAMETERS
t
d
t
pwH
t
pwL
DESCRIPTION
CLK to Data Valid Prop Delay
CLK High Pulse Width
CLK Low Pulse Width
MIN
-
20
20
TYP
5
-
-
300
-
MAX
UNITS
ns
ns
ns
SPT7810
4
3/11/97
CADEKA [ CADEKA MICROCIRCUITS LLC. ]
