ELECTRICAL SPECIFICATIONS
T
A
=T
MAX
to T
MAX
, AV
DD
=DV
DD
=+5.0 V, V
IN
=0 to 4 V, f
S
=40 MSPS, V
RHS
=4.0 V, V
RLS
=0.0 V, unless otherwise specified.
PARAMETERS
Dynamic Performance
Signal-to-Noise Ratio
(without Harmonics)
f
IN
=3.58 MHz
f
IN
=10.3 MHz
Harmonic Distortion
f
IN
=3.58 MHz
f
IN
=10.3 MHz
Signal-to-Noise and Distortion
(SINAD)
f
IN
=3.58 MHz
f
IN
=10.3 MHz
Spurious Free Dynamic Range
Differential Phase
Differential Gain
Intermodulation Distortion
Inputs
Logic 1 Voltage
Logic 0 Voltage
Maximum Input Current Low
Maximum Input Current High
Input Capacitance
Digital Outputs
Logic 1 Voltage
Logic 0 Voltage
t
RISE
t
FALL
Output Enable to Data Output Delay
Power Supply Requirements
Voltages
OV
DD
DV
DD
AV
DD
Currents
AI
DD
DI
DD
Power Dissipation
I
OH
= 0.5 mA
I
OL
= 1.6 mA
15 pF load
15 pF load
20 pF load, T
A
= +25
°C
50 pF load over temp.
TEST
CONDITIONS
TEST
LEVEL
MIN
SPT7734
TYP
MAX
UNITS
VI
VI
9 Distortion bins from
1024 pt FFT
VI
VI
46
45
53
53
49
48
57
56
dB
dB
dB
dB
VI
VI
f
IN
=1.0 MHz
V
V
V
46
45
49
48
63
±0.3
±0.3
TBD
dB
dB
dB
Degree
%
dB
V
V
µA
µA
pF
V
V
ns
ns
ns
ns
V
V
V
mA
mA
mW
VI
VI
VI
VI
V
VI
VI
V
V
V
V
IV
IV
IV
VI
VI
VI
2.0
-10
-10
+5
3.5
0.4
10
10
10
22
3.0
4.75
4.75
5.0
5.25
5.25
22
23
225
0.8
+10
+10
5.0
5.0
17
18
175
TEST LEVEL CODES
All electrical characteristics are subject to the
following conditions:
All parameters having min/max specifications
are guaranteed. The Test Level column indi-
cates the specific device testing actually per-
formed during production and Quality Assur-
ance inspection. Any blank section in the data
column indicates that the specification is not
tested at the specified condition.
TEST LEVEL
I
II
III
IV
V
VI
TEST PROCEDURE
100% production tested at the specified temperature.
100% production tested at T
A
=25
°C,
and sample
tested at the specified temperatures.
QA sample tested only at the specified temperatures.
Parameter is guaranteed (but not tested) by design
and characterization data.
Parameter is a typical value for information purposes
only.
100% production tested at T
A
= 25
°C.
Parameter is
guaranteed over specified temperature range.
SPT7734
3
1/27/98
CADEKA [ CADEKA MICROCIRCUITS LLC. ]
