ELECTRICAL SPECIFICATIONS
T
A
= T
MIN
to T
MAX
, AV
EE
= –5.2 V, V
RB
= –1.00 V, V
RM
= –0.5 V, V
RT
= 0.00 V, ƒ
CLK
= 1000 MSPS, Duty Cycle = 50%, unless otherwise specified.
PARAMETERS
Timing Characteristics
Clock to Data Ready delay (t
dr
)
Data Bank A
Data Bank B
Clock to Output Data (t
od
)
Data Bank A
Data Bank B
Output Data to Data Ready (t
odr
)
Data Bank A
Data Bank B
Output Data Skew (t
osk
)
Aperture Jitter
Acquisition Time
TEST
CONDITIONS
TEST
LEVEL
MIN
SPT7610
TYP
MAX
UNITS
+25 °C case
+25 °C case
+25 °C case
+25 °C case
–40 to 85 °C case
–40 to 85 °C case
–40 to 85 °C case
V
V
V
V
IV
IV
IV
V
V
1.68
1.73
2.14
2.00
1.54
1.73
–150
2
250
150
ns
ns
ns
ns
ns
ns
ps
ps
ps
Dynamic Performance
Spurious Free Dynamic Range (SFDR)
ƒ
IN
= 250 MHz
ƒ
IN
= 400 MHz
Signal-to-Noise and Distortion (SINAD)
ƒ
IN
= 250 MHz
ƒ
IN
= 400 MHz
Signal to Noise Ratio (SNR)
ƒ
IN
= 250 MHz
ƒ
IN
= 400 MHz
Total Harmonic Distortion (THD)
ƒ
IN
= 250 MHz
ƒ
IN
= 400 MHz
V
V
VI
VI
VI
VI
VI
VI
31
28
33
32
45
34
34
32
36
36
–40
–34
–37
–30
dB
dB
dB
dB
dB
dB
dB
dB
TEST LEVEL CODES
All electrical characteristics are subject to the
following conditions:
All parameters having min/max specifications
are guaranteed. The Test Level column indi-
cates the specific device testing actually per-
formed during production and Quality Assur-
ance inspection. Any blank section in the data
column indicates that the specification is not
tested at the specified condition.
Unless otherwise noted, all test are pulsed
tests; therefore, T
J
= T
C
= T
A
.
LEVEL
I
II
III
IV
V
VI
TEST PROCEDURE
100% production tested at the specified temperature.
100% production tested at T
A
= +25 °C, and sample tested at the
specified temperatures.
QA sample tested only at the specified temperatures.
Parameter is guaranteed (but not tested) by design and characteri-
zation data.
Parameter is a typical value for information purposes only.
100% production tested at T
A
= +25 °C. Parameter is guaranteed
over specified temperature range.
SPT7610
3
1/21/02