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ADS7824UB 参数 Datasheet PDF下载

ADS7824UB图片预览
型号: ADS7824UB
PDF下载: 下载PDF文件 查看货源
内容描述: 4通道,12位采样CMOS A / D转换器 [4 Channel, 12-Bit Sampling CMOS A/D Converter]
分类和应用: 转换器模数转换器光电二极管
文件页数/大小: 16 页 / 346 K
品牌: BURR-BROWN [ BURR-BROWN CORPORATION ]
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SPECIFICATIONS
(CONT)
ELECTRICAL
At T
A
= –40°C to +85°C, f
S
= 40kHz, V
S1
= V
S2
= V
S
= +5V
±5%,
using external reference, CONTC = 0V, unless otherwise specified.
ADS7824P, U
PARAMETER
DIGITAL TIMING
Bus Access Time
Bus Relinquish Time
Data Clock
Internal Clock (Output only when
transmitting data)
External Clock
POWER SUPPLIES
V
S1
= V
S2
= V
S
Power Dissipation
TEMPERATURE RANGE
Specified Performance
Storage
Thermal Resistance (θ
JA
)
Plastic DIP
SOIC
CONDITIONS
PAR/SER = +5V
PAR/SER = +5V
PAR/SER = 0V
EXT/INT LOW
EXT/INT HIGH
MIN
TYP
MAX
83
83
0.5
0.1
+4.75
f
S
= 40kHz
PWRD HIGH
–40
–65
75
75
+5
50
+85
+150
T
T
T
T
1.5
10
+5.25
50
T
T
T
T
T
T
T
MIN
ADS7824PB, UB
TYP
MAX
T
T
T
T
T
T
UNITS
ns
ns
MHz
MHz
V
mW
µW
°C
°C
°C/W
°C/W
NOTES: (1) An asterik (T) specifies same value as grade to the left. (2) LSB means Least Significant Bit. For the 12-bit,
±10V
input ADS7824, one LSB is 4.88mV. (3)
Typical rms noise at worst case transitions and temperatures. (4) Full scale error is the worst case of –Full Scale or +Full Scale untrimmed deviation from ideal first and
last code transitions, divided by the transition voltage (not divided by the full-scale range) and includes the effect of offset error. (5) All specifications in dB are referred
to a full-scale
±10V
input. (6) A full scale sinewave input on one channel will be attenuated by this amount on the other channels. (7) Useable Bandwidth defined as
Full-Scale input frequency at which Signal-to-(Noise+Distortion) degrades to 60dB, or 10 bits of accuracy. (8) The ADS7824 will accurately acquire any input step if given
a full acquisition period after the step. (9) Recovers to specified performance after 2 x FS input overvoltage, and normal acquisitions can begin.
PACKAGE/ORDERING INFORMATION
PACKAGE
DRAWING
NUMBER
(1)
246
246
217
217
TEMPERATURE
RANGE
–40°C to +85°C
–40°C to +85°C
–40°C to +85°C
–40°C to +85°C
MAXIMUM INTEGRAL
LINEARITY ERROR (LSB)
±1
±0.5
±1
±0.5
MINIMUM SIGNAL-
TO-(NOISE + DISTORTION)
RATIO (dB)
70
72
70
72
PRODUCT
ADS7824P
ADS7824PB
ADS7824U
ADS7824UB
PACKAGE
Plastic Dip
Plastic Dip
SOIC
SOIC
NOTE: (1) For detailed drawing and dimension table, please see end of data sheet, or Appendix C of Burr-Brown IC Data Book.
ABSOLUTE MAXIMUM RATINGS
Analog Inputs: AIN
0
, AIN
1
, AIN
2
, AIN
3
..............................................
±15V
REF ................................... (AGND2 –0.3V) to (V
S
+ 0.3V)
CAP ........................................ Indefinite Short to AGND2,
Momentary Short to V
S
V
S1
and V
S2
to AGND2 ........................................................................... 7V
V
S1
to V
S2
..........................................................................................
±0.3V
Difference between AGND1, AGND2 and DGND .............................
±0.3V
Digital Inputs and Outputs .......................................... –0.3V to (V
S
+ 0.3V)
Maximum Junction Temperature ..................................................... 150°C
Internal Power Dissipation ............................................................. 825mW
Lead Temperature (soldering, 10s) ................................................ +300°C
Maximum Input Current to Any Pin ................................................. 100mA
PIN CONFIGURATION
Top View
DIP/SOIC
AGND1
AIN
0
AIN
1
AIN
2
AIN
3
CAP
REF
AGND2
TRI-STATE
TRI-STATE
TRI-STATE
EXT/INT
SYNC
D7
1
2
3
4
5
6
7
8
9
ADS7824
28 V
S1
27 V
S2
26 PWRD
25 CONTC
24 BUSY
23 CS
22 R/C
21 BYTE
20 PAR/SER
19 A0
18 A1
17 D0
16 D1
15 D2
TAG
SDATA
DATACLK
ELECTROSTATIC
DISCHARGE SENSITIVITY
This integrated circuit can be damaged by ESD. Burr-Brown
recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling
and installation procedures can cause damage.
ESD damage can range from subtle performance degrada-
tion to complete device failure. Precision integrated circuits
may be more susceptible to damage because very small
parametric changes could cause the device not to meet its
published specifications.
3
D6 10
D5 11
D4 12
D3 13
DGND 14
®
ADS7824