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08055A100CAT2A 参数 Datasheet PDF下载

08055A100CAT2A图片预览
型号: 08055A100CAT2A
PDF下载: 下载PDF文件 查看货源
内容描述: 多层瓷介片状电容器 [Multilayer Ceramic Chip Capacitor]
分类和应用: 电容器
文件页数/大小: 46 页 / 399 K
品牌: KYOCERA AVX [ KYOCERA AVX ]
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General Description  
tends to de-age capacitors and is why re-reading of capac-  
itance after 12 or 24 hours is allowed in military specifica-  
tions after dielectric strength tests have been performed.  
Effects of Mechanical Stress – High “K” dielectric  
ceramic capacitors exhibit some low level piezoelectric  
reactions under mechanical stress. As a general statement,  
the piezoelectric output is higher, the higher the dielectric  
constant of the ceramic. It is desirable to investigate this  
effect before using high “K” dielectrics as coupling capaci-  
tors in extremely low level applications.  
Typical Curve of Aging Rate  
X7R Dielectric  
+1.5  
0
Reliability – Historically ceramic capacitors have been one  
of the most reliable types of capacitors in use today.  
The approximate formula for the reliability of a ceramic  
capacitor is:  
-1.5  
Lo  
Lt  
Vt  
X
Tt  
Y
=
͑ ͑  
͑ ͑  
V
T
o
o
-3.0  
-4.5  
where  
Lo = operating life  
Lt = test life  
Vt = test voltage  
Tt = test temperature and  
To = operating temperature  
in °C  
Vo = operating voltage  
X,Y = see text  
-6.0  
-7.5  
Historically for ceramic capacitors exponent X has been  
considered as 3. The exponent Y for temperature effects  
typically tends to run about 8.  
1
10  
100 1000 10,000 100,000  
Hours  
Characteristic Max. Aging Rate %/Decade  
None  
C0G (NP0)  
X7R  
Z5U  
A capacitor is a component which is capable of storing  
electrical energy. It consists of two conductive plates (elec-  
trodes) separated by insulating material which is called the  
dielectric. A typical formula for determining capacitance is:  
2
3
5
Y5V  
Figure 6  
.224 KA  
Effects of Frequency – Frequency affects capacitance  
and impedance characteristics of capacitors. This effect is  
much more pronounced in high dielectric constant ceramic  
formulation that is low K formulations. AVX’s SpiCap soft-  
ware generates impedance, ESR, series inductance, series  
resonant frequency and capacitance all as functions of fre-  
quency, temperature and DC bias for standard chip sizes  
and styles. It is available free from AVX.  
C =  
t
C = capacitance (picofarads)  
K = dielectric constant (Vacuum = 1)  
A = area in square inches  
t = separation between the plates in inches  
(thickness of dielectric)  
.224 = conversion constant  
(.0884 for metric system in cm)  
Capacitance – The standard unit of capacitance is the  
farad. A capacitor has a capacitance of 1 farad when 1  
coulomb charges it to 1 volt. One farad is a very large unit  
-6  
and most capacitors have values in the micro (10 ), nano  
-9  
-12  
(10 ) or pico (10 ) farad level.  
Dielectric Constant – In the formula for capacitance given  
above the dielectric constant of a vacuum is arbitrarily cho-  
sen as the number 1. Dielectric constants of other materials  
are then compared to the dielectric constant of a vacuum.  
Dielectric Thickness – Capacitance is indirectly propor-  
tional to the separation between electrodes. Lower voltage  
requirements mean thinner dielectrics and greater capaci-  
tance per volume.  
Area – Capacitance is directly proportional to the area of  
the electrodes. Since the other variables in the equation are  
usually set by the performance desired, area is the easiest  
parameter to modify to obtain a specific capacitance within  
a material group.  
38  
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