Typical Characteristics
All typical values are at T = 25°C, V = 5 V, unless otherwise specified.
A
CC
Parameter
Symbol
Test Conditions
VF = 0 V, f = 1 MHz
IF = 20 mA
Typ.
60
Units
pF
Fig.
Notes
Input Capacitance
CIN
1
1
Input Diode Temperature
Coefficient
DVF/DTA
-1.5
mV/°C
W
Resistance (Input-Output)
RI-O
VI-O = 500 V
1012
1.0
3
Capacitance (Input-Output)
Transistor DC Current Gain
Small Signal Current Transfer Ratio
CI-O
f = 1 MHz
pF
-
1, 11
1
hFE
VO = 5 V, IO = 3 mA
VCC = 5 V, VO = 2 V
250
21
DIO/DIF
|CMH|
%
7
1
Common Mode Transient Immu-
nity at Logic High Level Output
IF = 0 mA, RL = 8.2 kW,
VO (min) = 2.0 V,
VCM = 10 VP-P
1000
V/ms
10
1, 7
Common Mode Transient Immu-
nity at Logic Low Level Output
|CML|
BW
IF = 16 mA, RL = 8.2 kW,
VO (max) = 0.8 V,
VCM = 10 VP-P
-1000
9
V/ms
10
8
1, 7
8
Bandwidth
MHz
Multi-Channel Product Only
Parameter
Symbol
Test Conditions
Typ.
Units
Notes
Input-Input Insulation Leakage
Current
II-I
RH ≤ 65%, VI-I = 500 V, t = 5 s
1
pA
5, 9
1012
0.8
5
5
W
Resistance (Input-Input)
Capacitance (Input-Input)
RI-I
CI-I
VI-I = 500 V
f=1 MHz
pF
Notes:
1. Each channel of a multi-channel device.
2. Current Transfer Ratio is defined as the ratio of output collector current, I , to the forward LED input current, I , times 100%. CTR is known to
O
F
degrade slightly over the unit’s lifetime as a function of input current, temperature, signal duty cycle, and system on time. Refer to Application
Note 1002 for more detail. ln short, it is recommended that designers allow at least 20-25% guardband for CTR degradation.
3. Alldevicesareconsideredtwo-terminaldevices;measuredbetweenallinputleadsorterminalsshortedtogetherandalloutputleadsorterminals
shorted together.
4. The 4N55, 4N55/883B, HCPL-257K, HCPL-6530, HCPL-6531, and HCPL-653K dual channel parts function as two independent single channel units.
Use the single channel parameter limits. I = 0 mA for channel under test and I = 20 mA for other channels.
F
F
5. Measured between adjacent input pairs shorted together for each multichannel device.
6. propagation delay is measured from the 50% point on the leading edge of the input pulse to the 1.5 V point on the leading edge of the
t
PHL
output pulse. The t
propagation delay is measured from the 50% point on the trailing edge of the input pulse to the 1.5 V point on the trail-
PLH
ing edge of the output pulse.
7. CM is the maximum rate of rise of the common mode voltage that can be sustained with the output voltage in the logic low state (V < 0.8 V).
L
O
CM is the maximum rate of fall of the common mode voltage that can be sustained with the output voltage in the logic high state (V > 2.0
H
O
V).
8. Bandwidth is the frequency at which the ac output voltage is 3 dB below the low frequency asymptote. For the HCPL-5530 the typical bandwidth
is 2 MHz.
9. This is a momentary withstand test, not an operating condition.
10. Higher CTR minimums are available to support special applications.
11. Measured between each input pair shorted together and all output connections for that channel shorted together.
12. Standard parts receive 100% testing at 25°C (Subgroups 1 and 9). SMD and 883B parts receive 100% testing at 25, 125, and -55°C (Subgroups 1
and 9, 2 and 10, 3 and 11, respectively).
13. Not required for 4N55, 4N55/883B, HCPL-257K, 5962-8767901, and 5962-8767905 types.
14. Required for 4N55, 4N55/883B, HCPL-257K, 5962-8767901, and 5962-8767905 types only.
9
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