+12 V
D.U.T.
+12 V
1.2 k Ω
9.1 k Ω
V
CC
0.01 µF
0.01 µF
2.1 k Ω
100 Ω
Q
3
0.1 µF
0.1 µF
V
V
O
B
47 µF
Q
V
O
2
Q
1
(1 MΩ, 12 pF
V
IN
TEST INPUT)
15 k Ω
470
Ω
100 Ω
R
F
51 Ω
1 k Ω
GND
SINGLE CHANNEL TESTING,
INDEPENDENT V DEVICES
22 Ω
CC
1N4150
TRIM FOR UNITY GAIN
, Q , Q : 2N3904
Q
TYPICAL LINEARITY = +3 % AT V = 1 V
IN P-P
TYPICAL SNR = 50 dB
1
2
3
TYPICAL R = 375 Ω
F
TYPICAL V dc = 3.8 V
O
TYPICAL I = 9 mA
F
D.U.T.
+5 V
+15
+10
+15 V
T
= 25 ˚C
V
A
CC
100 Ω
SET I
20 k Ω
F
V
O
INDEPENDENT
DEVICES
+5
0
2N3053
1.6 Vdc
0.25 V
AC INPUT
V
CC
0.1 µF
ac
P-P
560 Ω
100 Ω
GND
COMMON
-5
COMMON V
DEVICES
CC
-10
V
DEVICES
CC
-15
-20
0.1
1.0
10
100
f - FREQUENCY - MHz
Figure 8. Frequency Response.
PULSE GEN.
Z
t
= 50 Ω
= 5 ns
O
r
D.U.T.
I
+5 V
F
V
CC
R
L
V
O
I
MONITOR
F
100 Ω
C
* = 50 pF
L
GND
SINGLE CHANNEL
OR COMMON V DEVICES
CC
10 % DUTY CYCLE
1/f < 100 µs
NOTES:
* C INCLUDES PROBE AND STRAY WIRING CAPACITANCE.
L
BASE LEAD NOT CONNECTED.
Figure 9. Switching Test Circuit.*
*JEDEC Registered Data.
11
AVAGO [ AVAGO TECHNOLOGIES LIMITED ]
