EEPROM
AS58LC1001
Austin Semiconductor, Inc.
AC ELECTRICAL CHARACTERISTICS FOR READ OPERATION
(-55oC < TC < 125oC; Vcc = 5V + .3V)
Test Conditions
z Input Pulse Levels:
0.0V to 3.0V
z Input rise and fall times:
z Output Load:
z Reference levels for measuring timing:
< 20ns
1 TTL Gate +100pF (including scope and jig)
1.5V,1.5V
-25
-30
ITEM DESCRIPTION
TEST CONDITION
CE\=OE\=VILWE\=VIH
SYMBOL
UNITS
MIN MAX MIN MAX
Address Access Time
tACC
tCE
--- 250
--- 250
10 120
---
---
10
300
300
130
ns
ns
ns
OE\=VILWE\=VIH
CE\=VILWE\=VIH
Chip Enable Access Time
Output Enable Acess Time
tOE
CE\=OE\=VILWE\=VIH
CE\=VILWE\=VIH
tOH
tDF
tDFR
tRR
Output Hold to Address Change
Output Disable to High-Z
0
0
---
0
0
---
ns
ns
75
75
CE\=OE\=VILWE\=VIH
CE\=OE\=VILWE\=VIH
0
0
350
600
0
0
350
600
ns
ns
RES\ to Output Delay
AC ELECTRICAL CHARACTERISTICS FOR SOFTWARE DATA
PROTECTION CYCLE OPERATION
PARAMETER
SYMBOL
UNITS
MIN
MAX
Byte Load Cycle Time
PS
tBLC
1.0
30
---
Write Cycle Time
tWC
15
mS
AC ELECTRICAL CHARACTERISTICS FOR DATA\ POLLING OPERATION
PARAMETER
SYMBOL
UNITS
MIN
MAX
Output Enable Hold Time
tOEH
0
---
ns
Output Enable to Write Setup Time
Write Start Time
tOES
0
---
---
15
ns
tDW
250
---
ns
Write Cycle Time
tWC
ms
Austin Semiconductor, Inc. reserves the right to change products or specifications without notice.
AS58LC1001
Rev. 1.0 12/08
6
AUSTIN [ AUSTIN SEMICONDUCTOR ]
