COTS PEM
BOOT SECTOR FLASH
Austin Semiconductor, Inc.
AS29LV016
TEST CONDITIONS
3.3 V
2.7 k:
Device
Under
Test
C
6.2 k:
L
Note: Diodes are IN3064 or equivalent
Figure 10. Test Setup
Table 11: Test Specifications
Test Condition
70
90
100
Unit
1 TTL gate
Output Load
Output Load Capacitance, CL (including jig capacitance)
Input Rise and Fall Times
30
100
5
100
pF
ns
0.0 or VCC
Input Pulse Levels
0.5 VCC
0.5 VCC
V
Input timing measurement reference levels
Output timing meausrement reference levels
Key to Switching Waveforms
WAVEFORM
INPUTS
OUTPUTS
Steady
Changing from H to L
Changing from L to H
Don’t Care, Any Change Permitted
Does Not Apply
Changing, State Unknown
Center Line is High Impedance State (High Z)
VCC
0.5 VCC
0.5 VCC
Input
Measurement Level
Output
0.0 V
Figure 11. Input Waveforms and Measurement Levels
Austin Semiconductor, Inc. reserves the right to change products or specifications without notice.
AS29LV016
Rev. 2.1 10/08
28