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AS29F040ECA-60/883C 参数 Datasheet PDF下载

AS29F040ECA-60/883C图片预览
型号: AS29F040ECA-60/883C
PDF下载: 下载PDF文件 查看货源
内容描述: 512K ×8 FLASH制服行业5.0V FLASH MEMORY [512K x 8 FLASH UNIFORM SECTOR 5.0V FLASH MEMORY]
分类和应用:
文件页数/大小: 27 页 / 1428 K
品牌: AUSTIN [ AUSTIN SEMICONDUCTOR ]
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FLASH  
AS29F040  
Austin Semiconductor, Inc.  
FIGURE 7: TEST CONDITIONS,  
Test Setup  
TABLE 6: TEST CONDITIONS,  
Test Specifications  
CONDITIONS  
Output Load  
-55  
ALL OTHERS UNIT  
1 TTL Gate  
Output Load Capacitance, C  
(including jig capacitance)  
L
30  
100  
pF  
Input Rise and Fall Times  
Input Pulse Levels  
5
20  
ns  
V
0ꢀ0 - 3ꢀ0  
0ꢀ45 - 2ꢀ4  
Input timing measurement  
reference levels  
Output timing measurement  
reference levels  
1ꢀ5  
1ꢀ5  
0ꢀ8, 2ꢀ0  
0ꢀ8, 2ꢀ0  
V
V
AC CHARACTERISTICS: Read-Only Operations  
1
SPEED OPTIONS  
SYMBOL  
PARAMETER  
JEDEC Std  
TEST SETUP  
MIN  
-55  
-70  
90  
-120 -150 UNITS  
3
t
t
55  
70  
90  
120 150  
120 150  
120 150  
ns  
Read Cycle Time  
AVAV  
RC  
CE\ = V  
IL  
Address to Output Delay  
t
t
MAX  
55  
70  
90  
ns  
AVQV  
ACC  
OE\ = V  
IL  
IL  
Chip Enable to Output Delay  
Output Enable to Output Delay  
t
t
OE\ = V  
MAX  
MAX  
MAX  
55  
30  
18  
18  
0
70  
30  
20  
20  
0
90  
35  
20  
20  
0
ns  
ns  
ns  
ns  
ns  
ELQV  
GLQV  
EHQZ  
CE  
t
t
t
t
50  
30  
30  
0
55  
35  
35  
0
OE  
2, 3  
t
t
Chip Enable to Output High Z  
DF  
2, 3  
Output Enable to Output High Z  
GHQZ  
DF  
Read  
MIN  
MIN  
3
t
Output Enable Hold Time  
OEH  
Toggle and  
Data Polling  
10  
0
10  
0
10  
0
10  
0
10  
0
ns  
ns  
Output Hold Time From Addresses  
CE\ or OE\, Whichever Occurs First  
t
t
MIN  
AXQX  
OH  
NOTES:  
1. See Figure 7 and Table 6 for test specifications.  
2. Output driver disable time.  
3. Not 100% tested.  
AS29F040  
AustinSemiconductor,Inc.reservestherighttochangeproductsorspecificationswithoutnotice.  
Rev. 2.2 09/07  
15  
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