Changes from Rev.
2503E-09/03 to Rev.
2503F-12/03
1. Updated “Calibrated Internal RC Oscillator” on page 29.
Changes from Rev.
2503D-02/03 to Rev.
2503E-09/03
1. Updated and changed “On-chip Debug System” to “JTAG Interface and On-
chip Debug System” on page 35.
2. Updated Table 15 on page 37.
3. Updated “Test Access Port – TAP” on page 219 regarding the JTAGEN fuse.
4. Updated description for Bit 7 – JTD: JTAG Interface Disable on page 228.
5. Added a note regarding JTAGEN fuse to Table 104 on page 257.
6. Updated Absolute Maximum Ratings* , DC Characteristics and ADC Charac-
teristics in “Electrical Characteristics” on page 287.
7. Added a proposal for solving problems regarding the JTAG instruction
IDCODE in “Errata” on page 336.
Changes from Rev.
2503C-10/02 to Rev.
2503D-02/03
1. Added EEAR9 in EEARH in “Register Summary” on page 327.
2. Added Chip Erase as a first step in“Programming the Flash” on page 284 and
“Programming the EEPROM” on page 285.
3. Removed reference to “Multi-purpose Oscillator” application note and
“32 kHz Crystal Oscillator” application note, which do not exist.
4. Added information about PWM symmetry for Timer0 and Timer2.
5. Added note in “Filling the Temporary Buffer (Page Loading)” on page 251
about writing to the EEPROM during an SPM Page Load.
6. Added “Power Consumption” data in “Features” on page 1.
7. Added section “EEPROM Write During Power-down Sleep Mode” on page 22.
8. Added note about Differential Mode with Auto Triggering in “Prescaling and
Conversion Timing” on page 204.
9. Updated Table 89 on page 232.
10.Added updated “Packaging Information” on page 333.
Changes from Rev.
2503B-10/02 to Rev.
2503C-10/02
1. Updated the “DC Characteristics” on page 287.
Changes from Rev.
2503A-03/02 to Rev.
2503B-10/02
1. Canged the endurance on the Flash to 10,000 Write/Erase Cycles.
2. Bit nr.4 – ADHSM – in SFIOR Register removed.
338
ATmega32(L)
2503J–AVR–10/06
ATMEL [ ATMEL ]
