ATmega8U2/16U2/32U2
TA = -40C to 85C, VCC = 2.7V to 5.5V (unless otherwise noted) (Continued)
Symbol
Parameter
Condition
Min.(5)
Typ.
Max.(5)
1500
Units
Idle mode
900
RPUDP
USB D+ Internal Pull-Up
Streaming mode
1425
3090
Active 8 MHz, VCC = 3V
regulator disabled
4
13.5
0.8
3.2
5
6
mA
mA
mA
mA
μA
Active 16 MHz, VCC = 5V
regulator enabled
21
1.2
4.0
10
15
65
Power Supply Current(6)
Idle 8 MHz, VCC = 3V
regulator disabled
Idle 16 MHz, VCC = 5V
regulator enabled
WDT disabled, regulator
disabled,VCC = 3V
ICC
WDT enabled, regulator
disabled,VCC = 3V
Power-down mode
10
μA
WDT, BOD, regulator
enabled, Vcc = 5V
40
μA
WDT disabled, BOD
Enabled, regulator disabled,
Vcc = 3V
250
μA
Standby mode - 8MHZ
XTAL
WDT disabled, BOD,
regulator enabled, Vcc = 5V
350
<10
μA
mV
nA
ns
VCC = 5V
Analog Comparator
Input Offset Voltage
VACIO
IACLK
tACID
Rusb
40
50
Vin = VCC/2
Analog Comparator
Input Leakage Current
VCC = 5V
-50
Vin = VCC/2
Analog Comparator
Propagation Delay
VCC = 2.7V
750
500
VCC = 4.0V
USB Series resistor
(external)
22±5%
3.3
Vcc 4.0V, I100mA,
UCAP=1μF±20%
Vreg
Regulator Output Voltage
3.0
4
3.6
5.5
V
V
C
UVcc
Note:
1. "Max" means the highest value where the pin is guaranteed to be read as low
2. "Min" means the lowest value where the pin is guaranteed to be read as high
3. Although each I/O port can sink more than the test conditions (20mA at VCC = 5V, 10mA at VCC = 3V) under steady state
conditions (non-transient), the following must be observed:
1.)The sum of all IOL, for ports B0-B7, C0-C7, D0-D7 should not exceed 150 mA.
If IOL exceeds the test condition, VOL may exceed the related specification. Pins are not guaranteed to sink current greater
than the listed test condition.
4. Although each I/O port can source more than the test conditions (20mA at VCC = 5V, 10mA at VCC = 3V) under steady
state conditions (non-transient), the following must be observed:
1.)The sum of all IOL, for ports B0-B7, C0-C7, D0-D7 should not exceed 150 mA.
If IOH exceeds the test condition, VOH may exceed the related specification. Pins are not guaranteed to source current
greater than the listed test condition.
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