37.11 ATmega2561 rev. C
• High current consumption in sleep mode
1. High current consumption in sleep mode.
If a pending interrupt cannot wake the part up from the selected sleep mode, the current
consumption will increase during sleep when executing the SLEEP instruction directly after
a SEI instruction.
Problem Fix/Workaround
Before entering sleep, interrupts not used to wake the part from the sleep mode should be
disabled.
37.12 ATmega2561 rev. B
Not sampled.
37.13 ATmega2561 rev. A
• Non-Read-While-Write area of flash not functional
• Part does not work under 2.4 Volts
• Incorrect ADC reading in differential mode
• Internal ADC reference has too low value
• IN/OUT instructions may be executed twice when Stack is in external RAM
• EEPROM read from application code does not work in Lock Bit Mode 3
1. Non-Read-While-Write area of flash not functional
The Non-Read-While-Write area of the flash is not working as expected. The problem is
related to the speed of the part when reading the flash of this area.
Problem Fix/Workaround
- Only use the first 248K of the flash.
- If boot functionality is needed, run the code in the Non-Read-While-Write area at maximum
1/4th of the maximum frequency of the device at any given voltage. This is done by writing
the CLKPR register before entering the boot section of the code.
434
ATmega640/1280/1281/2560/2561
2549L–AVR–08/07
ATMEL [ ATMEL ]
