2. High current consumption in sleep mode.
If a pending interrupt cannot wake the part up from the selected sleep mode, the current
consumption will increase during sleep when executing the SLEEP instruction directly after
a SEI instruction.
Problem Fix/Workaround
Before entering sleep, interrupts not used to wake the part from the sleep mode should be
disabled.
37.4 ATmega2560 rev. E
No known errata.
37.5 ATmega2560 rev. D
Not sampled.
37.6 ATmega2560 rev. C
• High current consumption in sleep mode
1. High current consumption in sleep mode.
If a pending interrupt cannot wake the part up from the selected sleep mode, the current
consumption will increase during sleep when executing the SLEEP instruction directly after
a SEI instruction.
Problem Fix/Workaround
Before entering sleep, interrupts not used to wake the part from the sleep mode should be
disabled.
37.7 ATmega2560 rev. B
Not sampled.
37.8 ATmega2560 rev. A
• Non-Read-While-Write area of flash not functional
• Part does not work under 2.4 volts
• Incorrect ADC reading in differential mode
• Internal ADC reference has too low value
• IN/OUT instructions may be executed twice when Stack is in external RAM
• EEPROM read from application code does not work in Lock Bit Mode 3
1. Non-Read-While-Write area of flash not functional
The Non-Read-While-Write area of the flash is not working as expected. The problem is
related to the speed of the part when reading the flash of this area.
Problem Fix/Workaround
- Only use the first 248K of the flash.
- If boot functionality is needed, run the code in the Non-Read-While-Write area at maximum
1/4th of the maximum frequency of the device at any given voltage. This is done by writing
the CLKPR register before entering the boot section of the code
2. Part does not work under 2.4 volts
The part does not execute code correctly below 2.4 volts
432
ATmega640/1280/1281/2560/2561
2549L–AVR–08/07
ATMEL [ ATMEL ]
