6. Test Interface
6.1
JTAG
This represents the boundary scan testing provisions specified by IEEE Standard
1149.1 of the Joint Testing Action Group (JTAG). The AT7912F test access port and on-
chip circuitry is fully compliant with the IEEE 1149.1 specification. The test access port
enables boundary scan testing of circuitry connected to the AT7912F I/O pins.
7. AT7912F differences with theT7906E
A few differences between the AT7912F and the T7906E exist in the registers, the sig-
nals and the pinout. These differences are detailed in the section 15 of the
‘SMCS116SpW User Manual”.
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ATMEL [ ATMEL ]
