APW6021
Reliability test program
Test item
Method
Description
245 C , 5 SEC
SOLDERABILITY
HOLT
MIL-STD-883D-2003
MIL-STD-883D-1005.7
JESD-22-B, A102
MIL-STD-883D-1011.9
MIL-STD-883D-3015.7
JESD 78
°
1000 Hrs Bias @ 125 C
°
PCT
168 Hrs, 100 % RH , 121 C
°
TST
-65 C ~ 150 C, 200 Cycles
°
°
ESD
VHBM > 2KV, VMM > 200V
10ms , Itr > 100mA
Latch-Up
Tape & Reel Dimensions
t
D
P
Po
E
P1
Bo
F
W
Ko
Ao
D1
T2
J
C
A
B
T1
A
B
C
J
T1
T2
W
P
E
Application
SOP- 28
330 1
62 1.5 12.75 0. 5
2
0.6 24.4 0.2 2 0.2
24 0.3 12 0.1 1.75 0.1
±
±
±
±
±
±
±
±
±
F
D
D1
Po
P1
Ao
Bo
Ko
t
Application
1.5 +0.1
1.5+ 0.25
SOP- 28 11.5 0.1
4.0 0.1 2.0 0.1 10.85 0.118.34 0.1 2.97 0.1 0.35 0.01
±
±
±
±
±
±
±
(mm)
Copyright ANPEC Electronics Corp.
Rev. P.4 - Mar., 2001
12
www.anpec.com.tw
ANPEC [ ANPEC ELECTRONICS COROPRATION ]
