APL5331
Reliability test program
Test item
SO LD ER A BILITY
H O LT
PC T
TST
M ethod
D escription
M IL-STD -883D -2003
M IL-STD -883D -1005.7
JESD -22-B, A102
M IL-STD -883D -1011.9
M IL-STD -883D -3015.7
JESD 78
245 C , 5 S EC
°
1000 H rs Bias @ 125
C
°
168 H rs, 100 % R H , 121 C
°
-65 C ~ 150 C , 200 C ycles
VH B M > 2KV, VM M > 200V
10m s , Itr > 100m A
°
°
ESD
Latch-U p
Carrier Tape
t
D
P
Po
E
F
P1
Bo
W
Ko
Ao
D1
T2
J
C
A
B
T1
Copyright ANPEC Electronics Corp.
Rev. A.8 - Oct., 2003
19
www.anpec.com.tw