ꢁWt6223ꢃ
ꢀLꢀCtꢃICꢁL CHꢁꢃꢁCtꢀꢃIstICs
table 2: ꢁbꢅoluꢄe Maximum ꢃaꢄingꢅ
PꢁꢃꢁMꢀtꢀꢃ
MIN
MꢁX
ꢂNIts
Supply Voltage (VBATT
)
-
-
+6
+5
V
V
Supply Voltage (VCC_WCDMA
)
RF Input Power (RFIN
GSM/EDGE Output Control Voltage (VRAMP
WCDMA Control Voltages (VMODE, VEN
Storage Temperature (TSTG
)
-
10
dBm
V
)
-0.3
0
1.8
3.5
150
)
V
)
-55
°C
Stresses in excess of the absolute ratings may cause permanent damage.
Functional operation is not implied under these conditions. Exposure
to absolute ratings for extended periods of time may adversely affect
reliabiliꢄy.
CEXT2
>+2500 V <-2500 V
WCDMA_IN
>+1500 V <-1500 V
VCC_WCDMA
>+1300 V <-1300 V
1
2
22
21
20
19
18
17
VMODE
>+1500 V <-1500 V
WCDMA_OUT
>+1500 V <-1500 V
VEN
3
GND
>+1500 V <-1500 V
DCS/PCS_IN
>+2500 V <-2500 V
DCS/PCS_OUT
>+2500 V <-2500 V
4
BS
5
GND
GND
>+2500 V <-2500 V
GND
TX_EN
>+2500 V <-2500 V
VBATT
>+2500 V <-2500 V
6
16
15
CEXT3
>+2500 V <-2500 V
7
CEXT1
>+2500 V <-2500 V
8
GND
14
13
12
VRAMP
>+2500 V <-2500 V
9
GND
GSM850/900_IN
>+2500 V <-2500 V
GSM850/900_OUT
>+2500 V <-2500 V
10
11
VCC_GSM
>+2500 V <-2500 V
Figure 3: ꢀsD Pin ꢃaꢄing
Electrostatic Discharge Sensitivity
The AWT6223R part was tested to determine the •ꢀ Rating for WCDMA_IN, VMODE, VEN, and
ESD sensitivity of each package pin with respect
WCDMA_OUT is +1500V and -1500V;
to Ground. Non-ground pins are stressed with 1 •ꢀ Rating for VCC_WCDMA is +1300V and -1300V;
positive pulse or 1 negative pulse with respect to •ꢀ Rating for DCS/PCS_IN, BS, Tx_EN, VBATT,
the Ground using the Human Body Model appara-
tus and waveform outlined in JESD22-A114C.01.
Determination of pass or fail is made according to
whether the part passes key RF tests against the
datasheet limits after stress. Results of the test are
presented in Figure 3:
CEXT1, VRAMP, GSM_IN, VCC_GSM, GSM_OUT,
CEXT3 and DCS/PCS_OUT is +2500V and
-2500V
It is very important to take all necessary precautions,
listed in Application Notes “ESD precautions for
ANADIGICS GaAs MMIC,” to avoid ESD damage to
Data Sheet - Rev 2.0
11/2008
3