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PALCE16V8H-5JC 参数 Datasheet PDF下载

PALCE16V8H-5JC图片预览
型号: PALCE16V8H-5JC
PDF下载: 下载PDF文件 查看货源
内容描述: EE CMOS 20引脚通用可编程阵列逻辑 [EE CMOS 20-Pin Universal Programmable Array Logic]
分类和应用:
文件页数/大小: 26 页 / 221 K
品牌: AMD [ AMD ]
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AMD  
ABSOLUTE MAXIMUM RATINGS  
OPERATING RANGES  
Commercial (C) Devices  
Storage Temperature . . . . . . . . . . . –65°C to +150°C  
Temperature (TA) Operating  
in Free Air . . . . . . . . . . . . . . . . . . . . . . . 0°C to +75°C  
Ambient Temperature  
with Power Applied . . . . . . . . . . . . . –55°C to +125°C  
Supply Voltage (VCC) with  
Supply Voltage with  
Respect to Ground . . . . . . . . . . . . +4.75 V to +5.25 V  
Respect to Ground . . . . . . . . . . . . . –0.5 V to +7.0 V  
DC Input Voltage . . . . . . . . . . . –0.5 V to VCC + 0.5 V  
Operating ranges define those limits between which the func-  
tionality of the device is guaranteed.  
DC Output or I/O  
Pin Voltage . . . . . . . . . . . . . . . –0.5 V to VCC + 0.5 V  
Static Discharge Voltage . . . . . . . . . . . . . . . . . 2001 V  
Latchup Current  
(TA = 0°C to 75°C) . . . . . . . . . . . . . . . . . . . . . 100 mA  
Stresses above those listed under Absolute Maximum Rat-  
ings may cause permanent device failure. Functionality at or  
above these limits is not implied. Exposure to Absolute Maxi-  
mum Ratings for extended periods may affect device reliabil-  
ity. Programming conditions may differ.  
DC CHARACTERISTICS over COMMERCIAL operating ranges unless otherwise  
specified  
Parameter  
Symbol  
Parameter Description  
Test Conditions  
Min  
Max  
Unit  
VOH  
Output HIGH Voltage  
IOH = –3.2 mA  
VCC = Min  
VIN = VIH or VIL  
VIN = VIH or VIL  
2.4  
V
VOL  
Output LOW Voltage  
IOL = 24 mA  
VCC = Min  
0.5  
V
VIH  
VIL  
Input HIGH Voltage  
Input LOW Voltage  
Guaranteed Input Logical HIGH  
Voltage for all Inputs (Note 1)  
2.0  
V
V
Guaranteed Input Logical LOW  
Voltage for all Inputs (Note 1)  
0.8  
IIH  
IIL  
Input HIGH Leakage Current  
Input LOW Leakage Current  
VIN = 5.25 V, VCC = Max (Note 2)  
VIN = 0 V, VCC = Max (Note 2)  
10  
–100  
10  
µA  
µA  
µA  
IOZH  
Off-State Output Leakage  
Current HIGH  
VOUT = 5.25 V, VCC = Max  
VIN = VIH or VIL (Note 2)  
IOZL  
Off-State Output Leakage  
Current LOW  
VOUT = 0 V, VCC = Max  
VIN = VIH or VIL (Note 2)  
–100  
µA  
ISC  
ICC  
Output Short-Circuit Current  
Supply Current (Dynamic)  
VOUT = 0.5 V, VCC = Max (Note 3)  
–30  
–150  
55  
mA  
mA  
Outputs Open (IOUT = 0 mA)  
VCC = Max, f = 15 MHz  
Notes:  
1. These are absolute values with respect to device ground and all overshoots due to system or tester noise are included.  
2. I/O pin leakage is the worst case of IIL and IOZL (or IIH and IOZH).  
3. Not more than one output should be shorted at a time and duration of the short-circuit should not exceed one second.  
VOUT = 0.5 V has been chosen to avoid test problems caused by tester ground degradation.  
PALCE16V8Q-10 (Com’l)  
2-51  
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