AMD
ABSOLUTE MAXIMUM RATINGS
OPERATING RANGES
Commercial (C) Devices
Temperature (TA)
Storage Temperature . . . . . . . . . . –65°C to +150°C
Ambient Temperature with
Power Applied . . . . . . . . . . . . . . . . –55°C to +125°C
Operating in Free Air . . . . . . . . . . . . . . 0°C to +75°C
Supply Voltage with Respect
to Ground . . . . . . . . . . . . . . . . . . . . –0.5 V to + 7.0 V
Supply Voltage (VCC
with Respect to Ground . . . . . . . . +4.75 V to +5.25 V
)
DC Input Voltage . . . . . . . . . . . –0.5 V to VCC + 1.0 V
Operating Ranges define those limits between which the func-
tionality of the device is guaranteed.
DC Output or I/O
Pin Voltage . . . . . . . . . . . . . . . –0.5 V to VCC + 1.0 V
Static Discharge Voltage . . . . . . . . . . . . . . . . . 2001 V
Latchup Current
(TA = 0°C to +75°C) . . . . . . . . . . . . . . . . . . . . 100 mA
Stresses above those listed under Absolute Maximum Rat-
ings may cause permanent device failure. Functionality at or
above these limits is not implied. Exposure to Absolute Maxi-
mum Ratings for extended periods may affect device reliabil-
ity. Programming conditions may differ.
DC CHARACTERISTICS over COMMERCIAL operating ranges unless otherwise
specified
Parameter
Symbol
Parameter Description
Test Conditions
Min
Max
Unit
VOH
Output HIGH Voltage
IOH = –3.2 mA
VCC = Min
VIN = VIH or VIL
VIN = VIH or VIL
2.4
V
VOL
Output LOW Voltage
IOL = 24 mA
VCC = Min
0.5
V
VIH
VIL
Input HIGH Voltage
Input LOW Voltage
Guaranteed Input Logical HIGH
Voltage for all Inputs (Note 1)
2.0
V
V
Guaranteed Input Logical LOW
Voltage for all Inputs (Note 1)
0.8
IIH
IIL
Input HIGH Leakage Current
Input LOW Leakage Current
VIN = 5.5 V, VCC = Max (Note 2)
VIN = 0 V, VCC = Max (Note 2)
10
–100
10
µA
µA
µA
IOZH
Off-State Output Leakage
Current HIGH
VOUT = 5.5 V, VCC = Max,
VIN = VIL or VIH (Note 2)
IOZL
Off-State Output Leakage
Current LOW
VOUT = 0 V, VCC = Max
–100
µA
VIN = VIL or VIH (Note 2)
ISC
Output Short-Circuit Current
Supply Current
VOUT = 0.5 V, VCC = Max (Note 3)
–30
–150
115
mA
mA
ICC
Outputs Open, (IOUT = 0 mA),
(Dynamic)
VCC = Max, f = 25 MHz
Notes:
1. These are absolute values with respect to the device ground and all overshoots due to system and tester noise are included.
2. I/O pin leakage is the worst case of IIL and IOZL (or IIH and IOZH).
3. Not more than one output should be tested at a time. Duration of the short-circuit test should not exceed one second.
VOUT = 0.5 V has been chosen to avoid test problems caused by tester ground degradation.
PALCE16V8H-7 (Com’l)
2-47
AMD [ AMD ]
