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L160DB90VC 参数 Datasheet PDF下载

L160DB90VC图片预览
型号: L160DB90VC
PDF下载: 下载PDF文件 查看货源
内容描述: 16兆位(2M ×8位/ 1的M× 16位) CMOS 3.0伏只引导扇区闪存 [16 Megabit (2 M x 8-Bit/1 M x 16-Bit) CMOS 3.0 Volt-only Boot Sector Flash Memory]
分类和应用: 闪存
文件页数/大小: 52 页 / 1792 K
品牌: AMD [ AMD ]
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D A T A S H E E T  
GENERAL DESCRIPTION  
The Am29LV160D is a 16 Mbit, 3.0 Volt-only Flash  
memory organized as 2,097,152 bytes or 1,048,576  
words. The device is offered in 48-ball FBGA, 44-pin  
SO, and 48-pin TSOP packages. The word-wide data  
(x16) appears on DQ15–DQ0; the byte-wide (x8) data  
appears on DQ7–DQ0. This device is designed to be  
programmed in-system with the standard system 3.0  
The host system can detect whether a program or  
erase operation is complete by observing the RY/BY#  
pin, or by reading the DQ7 (Data# Polling) and DQ6  
(toggle) status bits. After a program or erase cycle  
has been completed, the device is ready to read array  
data or accept another command.  
The sector erase architecture allows memory sec-  
tors to be erased and reprogrammed without affecting  
the data contents of other sectors. The device is fully  
erased when shipped from the factory.  
volt V  
supply. A 12.0 V V or 5.0 V  
are not re-  
CC  
PP  
CC  
quired for write or erase operations. The device can  
also be programmed in standard  
EPROM programmers.  
Hardware data protection measures include a low  
The device offers access times of 70, 90, and 120 ns,  
allowing high speed microprocessors to operate with-  
out wait states. To eliminate bus contention the device  
has separate chip enable (CE#), write enable (WE#)  
and output enable (OE#) controls.  
V
detector that automatically inhibits write opera-  
CC  
tions during power transitions. The hardware sector  
protection feature disables both program and erase  
operations in any combination of the sectors of mem-  
ory. This can be achieved in-system or via  
programming equipment.  
The device requires only a single 3.0 volt power sup-  
ply for both read and write functions. Internally  
generated and regulated voltages are provided for the  
program and erase operations.  
The Erase Suspend/Erase Resume feature enables  
the user to put erase on hold for any period of time to  
read data from, or program data to, any sector that is  
not selected for erasure. True background erase can  
thus be achieved.  
The Am29LV160D is entirely command set compatible  
with the JEDEC single-power-supply Flash stan-  
dard. Commands are written to the command register  
using standard microprocessor write timings. Register  
contents serve as input to an internal state-machine  
that controls the erase and programming circuitry.  
Write cycles also internally latch addresses and data  
needed for the programming and erase operations.  
Reading data out of the device is similar to reading  
from other Flash or EPROM devices.  
The hardware RESET# pin terminates any operation  
in progress and resets the internal state machine to  
reading array data. The RESET# pin may be tied to  
the system reset circuitry. A system reset would thus  
also reset the device, enabling the system micropro-  
cessor to read the boot-up firmware from the Flash  
memory.  
The device offers two power-saving features. When  
addresses have been stable for a specified amount of  
time, the device enters the automatic sleep mode.  
The system can also place the device into the  
standby mode. Power consumption is greatly re-  
duced in both these modes.  
Device programming occurs by executing the program  
command sequence. This initiates the Embedded  
Program algorithm—an internal algorithm that auto-  
matically times the program pulse widths and verifies  
proper cell margin. The Unlock Bypass mode facili-  
tates faster programming times by requiring only two  
write cycles to program data instead of four.  
AMD’s Flash technology combines years of Flash  
memory manufacturing experience to produce the  
highest levels of quality, reliability and cost effective-  
ness. The device electrically erases all bits within a  
sector simultaneously via Fowler-Nordheim tunnel-  
ing. The data is programmed using hot electron  
injection.  
Device erasure occurs by executing the erase com-  
mand sequence. This initiates the Embedded Erase  
algorithm—an internal algorithm that automatically  
preprograms the array (if it is not already programmed)  
before executing the erase operation. During erase,  
the device automatically times the erase pulse widths  
and verifies proper cell margin.  
2
Am29LV160D  
May 5, 2006 22358B7  
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