Revision 1.01 – September 21, 2005
S5920 – PCI Product: Quality System Overview
PRODUCT QUALIFICATIONS
Data Book
Group D verifies the material integrity and the reliabil-
ity of the package.
A qualification is a sequence of tests in which all
parameters, including the reliability of the device are
tested. It is this sequence of tests which initially qual-
ifies the part to be released for production.
Group E demonstrates the radiation hardness capa-
bility of the device. Performed on a generic basis by
device type or as required for an application.
Thorough reliability testing is performed on new prod-
uct and package families in order to ensure the
expectations of our customers are met. These tests
include environmental, mechanical and life testing per-
formed in accordance with Military Standards,
industrial accepted methods and AMCC Test Proce-
dures. Contact the factory for specific details regarding
your selected product/package combination.
MIL-STD-883 Method 5010
“Test Procedures For Custom Monolithic Microcir-
cuits”
This method establishes screening and quality con-
formance procedures for the testing of custom and
semicustom monolithic semiconductors to verify Class
B or Class S quality and reliability levels. Testing is
performed in conjunction with other documentation
such as MIL-I-38535 and an applicable detail
specification.
AMCC provides MIL-STD-883 Methods 5005 and
5010 testing for our military customers on contract as
well as MIL-H-38534 quality conformance screening
for hybrid customers.
It establishes the design, material, performance, con-
trol, and documentation requirements needed to
achieve prescribed levels of device quality and reliabil-
ity. AMCC can support qualification using this method.
MIL-STD-883 Method 5005
“Qualification And Quality Conformance Proce-
dures”
Until August of 1983, the qualification most commonly
used was Method 5005. Since that time, the newer
revision of MIL-STD-883 includes Method 5010, which
is better suited for semicustom devices (logic arrays
included). Either qualification is adequate, but it is
desirable to use the 5010 qualification procedure in
qualifying custom or semicustom devices.
Method 5005 establishes qualification and quality-con-
formance inspection procedures for semi-conductors
to ensure that the quality of devices and lot conform
with the requirements of the applicable procurement
document. The full requirements of Group A, B, C, D,
and E test and inspections are intended for use in ini-
tial device qualification—or requalification in the event
of product or process change—and in periodic testing
for retaining qualification.
Qualification Method 5005 VS. 5010
The primary difference between the two methods is in
the Group D test. Method 5005 uses electrically-good
devices, where method 5010 uses electrical rejects
and package-only parts for environmental tests. In
addition, Method 5010 is designed for smaller produc-
tion releases (i.e., 2000 devices/year) while Method
5005 is designed for large production releases.
Group A consists of electrical tests performed on an
inspection lot which has already passed the 100%
screening requirements. After a lot has passed the
100% screen tests, a random sample of parts is
selected from the total population of devices to form
the inspection lot. The inspection lot is then subjected
to these Group A electrical tests.
Generic Data
Group B inspection tests are used to monitor the fabri-
cation and assembly processes performed on each
inspection lot.
Under the provision of MIL-I-38535, a customer can
elect to qualify using generic data (similar device/fam-
ily). However, the provisions of the applicable contract
should be reviewed. In most cases generic data will
satisfy full qualification requirements.
Group C consists of a 1000-hour life test conducted to
verify die integrity.
Since many of the qualifications at AMCC are ongoing,
generic data may be available for this purpose.
AMCC Confidential and Proprietary
DS1596
18
AMCC [ APPLIED MICRO CIRCUITS CORPORATION ]
