“CROSSBOW” 32 X 32 800 MBIT/S CROSSPOINT SWITCH
S2024
Table 8. ECL 10K Input/Output DC Characteristics VEE = –5.2 V1
Tambient
25 oC
–730
–680
–980
–1105
–1475
–1620
–1980
–2000
30
0 oC
–770
–720
–1000
–1145
–1490
–1625
–1980
–2000
30
70 oC
–650
–600
–920
–1045
–1450
–1585
–1980
–2000
30
Units
mV
mV
mV
mV
mV
mV
mV
mV
µA
VOHmax
3
VIHmax
VOHmin
3
VIHmin
3
VILmax
VOLmax
VOLmin
3
VILmin
IIH2MAX
IIH2MAX
µA
–.5
–.5
–.5
Table 9. TTL Input/Output DC Characteristics
C
Symbol
Parameter
Test DC Conditions
COMM 0° /+70°
Units
Min
2.0
Typ 2 Max
Guaranteed input HIGH voltage for all
inputs
3
VIH
Input HIGH voltage
Input LOW voltage
V
V
Guaranteed input LOW voltage for all
inputs
3
VIL
0.8
VIK
IIH
Input clamp diode voltage VCC = Min, IIN = –18mA
Input HIGH current VCC = Max, VIN = 2.7V
Input HIGH current at MAX VCC = Max, VIN = 5.5V
Input LOW current VCC = Max, vIN = 0.5V
–0.8
–1.2
50
V
µA
mA
mA
II
1.0
IIL
–0.4
Notes
1. Data measured with VEE = –5.2 ± .1V assuming a +50°C rise between ambient (Ta) and junction temperature (Tj) for 0°C,
+25°C, and +70°C. These conditions will be met with an airflow of 400 for commercial environment.
2. Typical limits are at 25°C, VCC = 5.0V.
3a.These input levels provide zero noise immunity and should only be tested in a static, noise-free environment.
3b.Use extreme care in defining input levels for dynamic testing. Many ouputs may be charged at once, so there will be significant noise at the
device pins and they may not actually reach VIL or VIH until the noise has settled. AMCC recommends using VIL ≤ 0.4V and VIH ≥ 2.4V for
dynamic TTL testing and VILMIN and VIHMAX for ECL testing.
13
June 15, 1999 / Revision B
AMCC [ APPLIED MICRO CIRCUITS CORPORATION ]
