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CLK12P 参数 Datasheet PDF下载

CLK12P图片预览
型号: CLK12P
PDF下载: 下载PDF文件 查看货源
内容描述: 的Stratix II器件手册,卷1 [Stratix II Device Handbook, Volume 1]
分类和应用:
文件页数/大小: 768 页 / 5210 K
品牌: ALTERA [ ALTERA CORPORATION ]
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IEEE Std. 1149.1 JTAG Boundary-Scan Support  
Table 3–1. Stratix II JTAG Instructions  
JTAG Instruction  
Instruction Code  
Description  
Allows a snapshot of signals at the device pins to be captured and  
examined during normal device operation, and permits an initial  
data pattern to be output at the device pins. Also used by the  
SignalTap II embedded logic analyzer.  
SAMPLE/PRELOAD 00 0000 0101  
Allows the external circuitry and board-level interconnects to be  
tested by forcing a test pattern at the output pins and capturing test  
results at the input pins.  
EXTEST(1)  
BYPASS  
00 0000 1111  
11 1111 1111 Places the 1-bit bypass register between the TDIand TDOpins,  
which allows the BST data to pass synchronously through selected  
devices to adjacent devices during normal device operation.  
USERCODE  
00 0000 0111 Selects the 32-bit USERCODEregister and places it between the  
TDI and TDOpins, allowing the USERCODEto be serially shifted  
out of TDO.  
IDCODE  
00 0000 0110 Selects the IDCODEregister and places it between TDIand TDO,  
allowing the IDCODEto be serially shifted out of TDO.  
HIGHZ (1)  
00 0000 1011 Places the 1-bit bypass register between the TDIand TDOpins,  
which allows the BST data to pass synchronously through selected  
devices to adjacent devices during normal device operation, while  
tri-stating all of the I/O pins.  
CLAMP (1)  
00 0000 1010 Places the 1-bit bypass register between the TDIand TDOpins,  
which allows the BST data to pass synchronously through selected  
devices to adjacent devices during normal device operation while  
holding I/O pins to a state defined by the data in the boundary-scan  
register.  
ICR instructions  
Used when configuring a Stratix II device via the JTAG port with a  
USB Blaster, MasterBlaster™, ByteBlasterMV™, or ByteBlaster II  
download cable, or when using a .jam or .jbc via an embedded  
processor or JRunner.  
PULSE_NCONFIG  
00 0000 0001 Emulates pulsing the nCONFIGpin low to trigger reconfiguration  
even though the physical pin is unaffected.  
Allows configuration of I/O standards through the JTAG chain for  
JTAG testing. Can be executed before, during, or after  
CONFIG_IO (2)  
00 0000 1101  
configuration. Stops configuration if executed during configuration.  
Once issued, the CONFIG_IOinstruction holds nSTATUSlow to  
reset the configuration device. nSTATUSis held low until the IOE  
configuration register is loaded and the TAP controller state  
machine transitions to the UPDATE_DRstate.  
SignalTap II  
instructions  
Monitors internal device operation with the SignalTap II embedded  
logic analyzer.  
Notes to Table 3–1:  
(1) Bus hold and weak pull-up resistor features override the high-impedance state of HIGHZ, CLAMP, and EXTEST.  
(2) For more information on using the CONFIG_IOinstruction, see the MorphIO: An I/O Reconfiguration Solution for  
Altera Devices White Paper.  
3–2  
Altera Corporation  
May 2007  
Stratix II Device Handbook, Volume 1