AS7C3513B
®
AC test conditions
- Output load: see Figure B.
Thevenin equivalent:
- Input pulse level: GND to 3.0V. See Figure A.
- Input rise and fall times: 2 ns. See Figure A.
- Input and output timing reference levels: 1.5V.
168Ω
Dout
+1.728V
+3.3V
320Ω
Dout
350Ω
+3.0V
C13
90%
10%
90%
10%
2 ns
Figure A: Input pulse
GND
GND
Figure B: 3.3V Output load
Notes
1
2
3
4
5
6
7
8
9
During VCC power-up, a pull-up resistor to VCC on CE is required to meet ISB specification.
This parameter is sampled, but not 100% tested.
For test conditions, see AC Test Conditions, Figures A and B.
These parameters are specified with CL = 5pF, as in Figure B. Transition is measured ±500mV from steady-state voltage.
This parameter is guaranteed, but not 100% tested.
WE is High for read cycle.
CE and OE are Low for read cycle.
Address valid prior to or coincident with CE transition Low.
All read cycle timings are referenced from the last valid address to the first transitioning address.
10 Not applicable.
11 All write cycle timings are referenced from the last valid address to the first transitioning address.
12 Not applicable.
13 C=30pF, except on High Z and Low Z parameters, where C=5pF.
3/24/04, v.1.2
Alliance Semiconductor
P. 7 of 10
ALSC [ ALLIANCE SEMICONDUCTOR CORPORATION ]
