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+5V
1N3064
or equivalent
2.7KΩ
Device under test
100 pF*
6.2KΩ
1N3064
or equivalent
GND
GND
*including scope
and jig capacitance
GND
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Parameter
Min
-1.0
-1.0
-100
Max
Unit
V
Input voltage with respect to V on pin A9
+13.5
VCC+1.0
+100
SS
Input voltage with respect to VSS on all DQ pins
Current
V
mA
Includes all pins except V . Test conditions: V = 5.0V, one pin at a time.
CC
CC
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Symbol
Parameter
Test setup
IN = 0
OUT = 0
IN = 0
Typical
6
Max
7.5
12
Unit
C
Input capacitance
V
pF
IN
COUT
Output capacitance
Control pin capacitance
V
8.5
pF
C
V
7.5
9
µF
IN2
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Symbol
Parameter
Test setup
IN = 0
OUT = 0
IN = 0
Typical
Max
Unit
Input capacitance
Output capacitance
Control pin capacitance
V
4
8
8
6
pF
CIN
COUT
V
12
12
pF
C
V
µF
IN2
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Limits
Parameter
Min
Typical
6.0
Max
8.2
8.2
80
Unit
sec
Sector erase and Verify-1 time (excludes 00h programming prior to erase)
Sector programming time
-
-
-
sec
Chip programming time
-
-
48
sec
Erase program cycles
10,000
200
200
-
cycles
µs
Byte program time
250
250
-
Byte verify-0 time
-
µs
;
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ALSC [ ALLIANCE SEMICONDUCTOR CORPORATION ]
