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ALD1726SA 参数 Datasheet PDF下载

ALD1726SA图片预览
型号: ALD1726SA
PDF下载: 下载PDF文件 查看货源
内容描述: EPAD ™ ULTRA微功耗运算放大器 [EPAD⑩ ULTRA MICROPOWER OPERATIONAL AMPLIFIER]
分类和应用: 运算放大器光电二极管
文件页数/大小: 10 页 / 69 K
品牌: ALD [ ADVANCED LINEAR DEVICES ]
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DEFINITIONS AND DESIGN NOTES:  
ADDITIONAL DESIGN NOTES:  
A. TheALD1726E/ALD1726isinternallycompensatedforunity  
gainstabilityusinganovelschemewhichproducesasinglepole  
role off in the gain characteristics while providing more than 60  
degrees of phase margin at unity gain frequency. A unity gain  
buffer using the ALD1726E/ALD1726 will typically drive 25pF of  
external load capacitance.  
1. Initial Input Offset Voltage is the initial offset voltage of the  
ALD1726E/ALD1726 operational amplifier when shipped from  
the factory. The device has been pre-programmed and tested  
for programmability.  
2. Offset Voltage Program Range is the range of adjustment of  
user specified target offset voltage. This is typically an adjust-  
ment in either the positive or the negative direction of the input  
offset voltage from an initial input offset voltage. The input  
offset programming pins, VE1 or VE2, change the input offset  
voltage in the negative or positive direction, respectively. User  
specified target offset voltage can be any offset voltage within  
this programming range.  
B. The ALD1726E/ALD1726 has complementary p-channel  
and n-channel input differential stages connected in parallel to  
accomplish rail-to-rail input common mode voltage range. The  
switchingpointbetweenthetwodifferentialstagesis1.5Vbelow  
positive supply voltage. For applications such as inverting  
amplifier or non-inverting amplifier with a gain larger than 2.5  
(5V operation), the common mode voltage does not make  
excursions below this switching point. However, this switching  
doestakeplaceiftheoperationalamplifierisconnectedasarail-  
to-rail unity gain buffer and the design must allow for input offset  
voltage variations.  
3. Programmed Input Offset Voltage Error is the final offset  
voltage error after programming when the Input Offset Voltage  
is at target Offset Voltage. This parameter is sample tested.  
4. Total Input Offset Voltage is the same as Programmed Input  
Offset Voltage, corrected for system offset voltage error. Usu-  
ally this is an all inclusive system offset voltage, which also  
includes offset voltage contributions from input offset voltage,  
C. TheoutputstageconsistsofclassABcomplementaryoutput  
drivers. The oscillation resistant feature, combined with the rail-  
to-railinputandoutputfeature, makestheALD1726E/ALD1726  
an effective analog signal buffer for high source impedance  
sensors, transducers, and other circuit networks.  
PSRR, CMRR, TCV  
and noise. It can also include errors  
OS  
introduced by external components, at a system level. Pro-  
grammed Input Offset Voltage and Total Input Offset Voltage is  
not necessarily zero offset voltage, but an offset voltage set to  
compensate for other system errors as well. This parameter is  
sample tested.  
D. The ALD1726E/ALD1726 has static discharge protection.  
Care must be exercised when handling the device to avoid  
strong static fields that may degrade a diode junction, causing  
increased input leakage currents. The user is advised to power  
up the circuit before, or simultaneously with, any input voltages  
applied and to limit input voltages not to exceed 0.3V of the  
power supply voltage levels.  
5. The Input Offset and Bias Currents are essentially input  
protection diode reverse bias leakage currents. This low input  
bias current assures that the analog signal from the source will  
not be distorted by it. For applications where source impedance  
is very high, it may be necessary to limit noise and hum pickup  
through proper shielding.  
E. VE1 and VE2 are high impedance terminals, as the internal  
bias currents are set very low to a few microamperes to  
conserve power. For some applications, these terminals may  
need to be shielded from external coupling sources. For ex-  
ample, digital signals running nearby may cause unwanted  
offset voltage fluctuations. Care during the printed circuit board  
layout to place ground traces around these pins and to isolate  
them from digital lines will generally eliminate such coupling  
effects. In addition, optional decoupling capacitors of 1000pF or  
greater value can be added to VE1 and VE2 terminals.  
6. Input Voltage Range is determined by two parallel comple-  
mentary input stages that are summed internally, each stage  
having a separate input offset voltage. While Total Input Offset  
Voltage can be trimmed to a desired target value, it is essential  
to note that this trimming occurs at only one user selected input  
bias voltage. Depending on the selected input bias voltage  
relative to the power supply voltages, offset voltage trimming  
may affect one or both input stages. For the ALD1726E/  
ALD1726, the switching point between the two stages occur at  
approximately 1.5V below positive supply voltage.  
F. The ALD1726E/ALD1726 is designed for use in low voltage,  
micropower circuits. The maximum operating voltage during  
normaloperationshouldremainbelow10Voltsatalltimes.Care  
shouldbetakentoinsurethattheapplicationinwhichthedevice  
is used do not experience any positive or negative transient  
voltages that will cause any of the terminal voltages to exceed  
this limit.  
7. Input Offset Voltage Drift is the average change in Total Input  
Offset Voltage as a function of ambient temperature. This  
parameter is sample tested.  
8. Initial PSRR and initial CMRR specifications are provided as  
reference information. After programming, error contribution to  
theoffsetvoltagefromPSRR andCMRRissettozerounderthe  
specific power supply and common mode conditions, and  
becomes part of the Programmed Input Offset Voltage Error.  
G. AllinputsorunusedpinsexceptVE1andVE2pinsshouldbe  
connected to a supply voltage such as Ground so that they do  
not become floating pins, since input impedance at these pins  
is very high. If any of these pins are left undefined, they may  
cause unwanted oscillation or intermittent excessive current  
drain. As these devices are built with CMOS technology, normal  
operating and storage temperature limits, ESD and latchup  
handling precautions pertaining to CMOS device handling  
should be observed.  
9. AverageLongTermInputOffsetVoltageStabilityisbasedon  
input offset voltage shift through operating life test at 125°C  
extrapolated to TA = 25 °C, assuming activation energy of  
1.0eV. This parameter is sample tested.  
10  
Advanced Linear Devices  
ALD1726E/ALD1726